- An experimental technique that allows faster assessment of out-of-plane strain dynamics of thin film heterostructures via x-ray diffraction is presented. In contrast to conventional high-speed reciprocal space-mapping setups, our approach reduces the measurement time drastically due to a fixed measurement geometry with a position-sensitive detector. This means that neither the incident (ω) nor the exit (2θ) diffraction angle is scanned during the strain assessment via x-ray diffraction. Shifts of diffraction peaks on the fixed x-ray area detector originate from an out-of-plane strain within the sample. Quantitative strain assessment requires the determination of a factor relating the observed shift to the change in the reciprocal lattice vector. The factor depends only on the widths of the peak along certain directions in reciprocal space, the diffraction angle of the studied reflection, and the resolution of the instrumental setup. We provide a full theoretical explanation and exemplify the concept with picosecond strain dynamics ofAn experimental technique that allows faster assessment of out-of-plane strain dynamics of thin film heterostructures via x-ray diffraction is presented. In contrast to conventional high-speed reciprocal space-mapping setups, our approach reduces the measurement time drastically due to a fixed measurement geometry with a position-sensitive detector. This means that neither the incident (ω) nor the exit (2θ) diffraction angle is scanned during the strain assessment via x-ray diffraction. Shifts of diffraction peaks on the fixed x-ray area detector originate from an out-of-plane strain within the sample. Quantitative strain assessment requires the determination of a factor relating the observed shift to the change in the reciprocal lattice vector. The factor depends only on the widths of the peak along certain directions in reciprocal space, the diffraction angle of the studied reflection, and the resolution of the instrumental setup. We provide a full theoretical explanation and exemplify the concept with picosecond strain dynamics of a thin layer of NbO2.…
MetadatenAuthor details: | Steffen Peer ZeuschnerORCiDGND, Maximilian MatternORCiD, Jan-Etienne PudellORCiDGND, Alexander von ReppertORCiDGND, Matthias RössleORCiDGND, Wolfram LeitenbergerGND, Jutta SchwarzkopfORCiD, Jos BoschkerORCiD, Marc HerzogORCiDGND, Matias BargheerORCiDGND |
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DOI: | https://doi.org/10.1063/4.0000040 |
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ISSN: | 2329-7778 |
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Pubmed ID: | https://pubmed.ncbi.nlm.nih.gov/33532514 |
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Title of parent work (English): | Structural dynamics |
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Subtitle (English): | a time-efficient approach to femtosecond x-ray diffraction |
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Publisher: | AIP Publishing LLC |
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Place of publishing: | Melville, NY |
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Publication type: | Article |
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Language: | English |
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Date of first publication: | 2020/09/25 |
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Publication year: | 2021 |
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Release date: | 2021/03/17 |
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Volume: | 8 |
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Issue: | 1 |
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Article number: | 014302 |
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Number of pages: | 10 |
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Funding institution: | Universität Potsdam |
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Funding institution: | BMBF, Federal Ministry of Education & Research (BMBF) |
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Funding number: | PA 2021_008 |
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Funding number: | 05K16IPA |
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Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
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DDC classification: | 5 Naturwissenschaften und Mathematik / 50 Naturwissenschaften / 500 Naturwissenschaften und Mathematik |
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| 5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik |
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Peer review: | Referiert |
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Grantor: | Publikationsfonds der Universität Potsdam |
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Publishing method: | Open Access / Gold Open-Access |
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License (German): | CC-BY - Namensnennung 4.0 International |
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External remark: | Zweitveröffentlichung in der Schriftenreihe Postprints der Universität Potsdam : Mathematisch-Naturwissenschaftliche Reihe ; 1137 |
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