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no (18)
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Pietsch, Ullrich (18)
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1999 (18)
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Article
(17)
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(1)
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English
(18)
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(18)
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Institut für Physik und Astronomie
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Scanning system for high-energy electron diffractometry
(1999)
Avilov, Anatoly S.
;
Kulygin, Alexander K.
;
Pietsch, Ullrich
;
Spence, John C. H.
;
Tsirelson, Vladimir G.
;
Zuo, Ming J.
Investigation of molecular diffusion across organic multilayers using neutron specular reflectivity
(1999)
Englisch, Uwe
;
Katholy, Stefan
;
Penacorada, Florencio
;
Reiche, Jürgen
;
Pietsch, Ullrich
X-ray and neutron reflection analysis of the structure and the molecular exchange process in simple and complex fatty acid salt Langmuir-Blodgett multilayers
(1999)
Englisch, Uwe
;
Penacorada, Florencio
;
Brehmer, Ludwig
;
Pietsch, Ullrich
Competition of alignment and aggregation? : Phenomena in constrained films of LC poly(olefin ulfone)s and maleic anhydride co- and terpolymers
(1999)
Geue, Thomas
;
Pietsch, Ullrich
;
Haferkorn, J.
;
Stumpe, Joachim
;
Date, R. W.
;
Fawcett, A. H.
Investigation of pH-dependent domain structure of fatty acid salt Langmuir-Blodgett films by means of X-ray diffuse scattering and Atomic Force Microscopy
(1999)
Geue, Thomas
;
Schultz, M.
;
Englisch, Uwe
;
Stömmer, Ralph
;
Pietsch, Ullrich
;
Meine, Kerstin
;
Vollhard, D.
HRXRD and GID investigations of a self-organized SiGe quantum dot multilayer
(1999)
Holý, Václav
;
Darhuber, A.
;
Stangl, Jochen
;
Zerlauth, S.
;
Schäffler, F.
;
Bauer, Günther
;
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
;
Vavra, I.
High-resolution x-ray scattering from thin films and multilayers
(1999)
Holý, Václav
;
Pietsch, Ullrich
;
Baumbach, Tilo
Lateral arrangement of self-assembled quantum dots in an SiGe/Si superlattice
(1999)
Holý, Václav
;
Stangl, Jochen
;
Zerlauth, S.
;
Bauer, Günther
;
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
Strain investigation of low strained buried gratings by grazing incidence X-Ray diffraction and the theory of elasticity
(1999)
Lübbert, Daniel
;
Baumbach, Tilo
;
Ponti, S.
;
Pietsch, Ullrich
;
Leprince, L.
;
Schneck, J.
;
Talneau, A.
High-resolution lattice parameter measurement by x-ray grazing incidence diffraction: Application to the interface of silicon on sapphire
(1999)
Metzger, T. H.
;
Pietsch, Ullrich
;
Garstein, E.
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