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no (18)
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Author
Pietsch, Ullrich (18)
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1999 (18)
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Article
(17)
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(1)
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English
(18)
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(18)
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Institut für Physik und Astronomie
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Scanning system for high-energy electron diffractometry
(1999)
Avilov, Anatoly S.
;
Kulygin, Alexander K.
;
Pietsch, Ullrich
;
Spence, John C. H.
;
Tsirelson, Vladimir G.
;
Zuo, Ming J.
Competition of alignment and aggregation? : Phenomena in constrained films of LC poly(olefin ulfone)s and maleic anhydride co- and terpolymers
(1999)
Geue, Thomas
;
Pietsch, Ullrich
;
Haferkorn, J.
;
Stumpe, Joachim
;
Date, R. W.
;
Fawcett, A. H.
Chemical modification of Topaz surfaces
(1999)
Struth, Bernd
;
Decher, Gero
;
Schmitt, J.
;
Hofmeister, Wolfgang
;
Neißendorfer, Frank
;
Pietsch, Ullrich
;
Brezesinski, Gerald
;
Möhwald, Helmuth
Lateral arrangement of self-assembled quantum dots in an SiGe/Si superlattice
(1999)
Holý, Václav
;
Stangl, Jochen
;
Zerlauth, S.
;
Bauer, Günther
;
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
X-ray and neutron reflection analysis of the structure and the molecular exchange process in simple and complex fatty acid salt Langmuir-Blodgett multilayers
(1999)
Englisch, Uwe
;
Penacorada, Florencio
;
Brehmer, Ludwig
;
Pietsch, Ullrich
High-resolution x-ray scattering from thin films and multilayers
(1999)
Holý, Václav
;
Pietsch, Ullrich
;
Baumbach, Tilo
High-resolution lattice parameter measurement by x-ray grazing incidence diffraction: Application to the interface of silicon on sapphire
(1999)
Metzger, T. H.
;
Pietsch, Ullrich
;
Garstein, E.
Investigation of the in-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001]
(1999)
Ulyanenkov, A.
;
Baumbach, Tilo
;
Darowski, Nora
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Wiebach, T.
Si(1-x)Ge(x) laterally graded crystals as monochromators for X-Ray absorption spectroscopy studies
(1999)
Veldkamp, Markus
;
Erko, Alexei
;
Gudat, Wolfgang
;
Abrosimov, Nikolai V.
;
Alex, Volker
;
Khasanov, Salavat
;
Neissendorfer, Frank
;
Pietsch, Ullrich
;
Shekhtman, Veniamin
Experimental determination of electric field induced differences in structure factor phases in the order of 2%
(1999)
Stahn, Jochen
;
Pucher, Andreas
;
Pietsch, Ullrich
;
Zellner, J.
;
Weckert, E.
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