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no (18)
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Pietsch, Ullrich (18)
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1999 (18)
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Article
(17)
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(1)
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English
(18)
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(18)
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Institut für Physik und Astronomie
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Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high-resolution x-ray diffrcation and grazing-incidence diffraction
(1999)
Zhuang, Y.
;
Holý, Václav
;
Stangl, Jochen
;
Darhuber, A.
;
Mikulik, P.
;
Zerlauth, S.
;
Schäffler, F.
;
Bauer, Günther
;
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
In-situ characterization of strain distribution in broad-area high-power lasers under operation by high- resolution x-ray diffrcation and topography using synchrotron radiation
(1999)
Zeimer, Ute
;
Baumbach, Tilo
;
Grenzer, Jörg
;
Lübbert, Daniel
;
Mazuelas, A.
;
Pietsch, Ullrich
;
Erbert, G.
Si(1-x)Ge(x) laterally graded crystals as monochromators for X-Ray absorption spectroscopy studies
(1999)
Veldkamp, Markus
;
Erko, Alexei
;
Gudat, Wolfgang
;
Abrosimov, Nikolai V.
;
Alex, Volker
;
Khasanov, Salavat
;
Neissendorfer, Frank
;
Pietsch, Ullrich
;
Shekhtman, Veniamin
Evaluation of strain distribution in freestanding and bruied lateral nanostructures
(1999)
Ulyanenkov, A.
;
Darowski, Nora
;
Grenzer, Jörg
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
Investigation of the in-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001]
(1999)
Ulyanenkov, A.
;
Baumbach, Tilo
;
Darowski, Nora
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Wiebach, T.
Chemical modification of Topaz surfaces
(1999)
Struth, Bernd
;
Decher, Gero
;
Schmitt, J.
;
Hofmeister, Wolfgang
;
Neißendorfer, Frank
;
Pietsch, Ullrich
;
Brezesinski, Gerald
;
Möhwald, Helmuth
Experimental determination of electric field induced differences in structure factor phases in the order of 2%
(1999)
Stahn, Jochen
;
Pucher, Andreas
;
Pietsch, Ullrich
;
Zellner, J.
;
Weckert, E.
Energy-dispersive reflectometry and diffractometry at the WLS of BESSY-I
(1999)
Neißendorfer, Frank
;
Pietsch, Ullrich
;
Breszisinski, G.
;
Möhwald, Helmuth
High-resolution lattice parameter measurement by x-ray grazing incidence diffraction: Application to the interface of silicon on sapphire
(1999)
Metzger, T. H.
;
Pietsch, Ullrich
;
Garstein, E.
Strain investigation of low strained buried gratings by grazing incidence X-Ray diffraction and the theory of elasticity
(1999)
Lübbert, Daniel
;
Baumbach, Tilo
;
Ponti, S.
;
Pietsch, Ullrich
;
Leprince, L.
;
Schneck, J.
;
Talneau, A.
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