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Gössel, Michael
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Sogomonyan, Egor S.
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Saposhnikov, V. V.
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Saposhnikov, Vl. V.
(20)
Morosov, Andrej
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Design for testability (DFT)
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X-masking
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test response compaction
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Institut für Informatik und Computational Science
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Institut für Mathematik
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Synthesis of code-disjoint combinational circuits
(1997)
Hartje, Hendrik
;
Gössel, Michael
;
Sogomonyan, Egor S.
Testability evaluation of sequential designs incorporating the multi-mode scannable memory element
(1999)
Singh, Adit D.
;
Sogomonyan, Egor S.
;
Gössel, Michael
;
Seuring, Markus
A method of construction of combinational self-checking units with detection of all single faults
(1999)
Saposhnikov, V. V.
;
Saposhnikov, Vl. V.
;
Gössel, Michael
;
Morosov, Andrej
Self-parity combinational-circuits for self-testing, concurrent fault-detection and parity scan design
(1994)
Gössel, Michael
;
Sogomonyan, Egor S.
A new totally error propagating compactor for arbitrary cores with digital interfaces
(1999)
Gössel, Michael
;
Sogomonyan, Egor S.
;
Morosov, Andrej
Design of combinational self-testing devices with unidirectionally independent outputs
(1994)
Gössel, Michael
;
Morosov, Andrej
;
Saposhnikov, V. V.
;
Saposhnikov, VL. V.
Self-checking Output-duplicated Booth-2 Multiplier
(2005)
Marienfeld, Daniel
;
Sogomonyan, Egor S.
;
Ocheretnij, V.
;
Gössel, Michael
A scan based concrrent BIST approach for low cost on-line testing
(1998)
Sogomonyan, Egor S.
;
Singh, Adit D.
;
Gössel, Michael
Fehlerkorrektur und Fehlererkennung
(2006)
Sogomonyan, Egor S.
;
Marienfeld, Daniel
;
Gössel, Michael
Grundlagen digitaler Systeme
(2005)
Börner, Ferdinand
;
Gössel, Michael
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