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(64)
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Gössel, Michael
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(20)
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(20)
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Design for testability (DFT)
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test response compaction
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On-line testing by self-dual duplication
(1997)
Dimitriev, Alexej
;
Saposhnikov, Vl. V.
;
Gössel, Michael
;
Saposhnikov, V. V.
A new design method for self-checking unidirectional combinational circuits
(1998)
Saposhnikov, V. V.
;
Morosov, Andrej
;
Saposhnikov, Vl. V.
;
Gössel, Michael
A structural approach for space compaction for concurrent checking and BIST
(1998)
Seuring, Markus
;
Gössel, Michael
;
Sogomonyan, Egor S.
A new parity preserving multi-input signature analyser
(1995)
Sogomonyan, Egor S.
;
Gössel, Michael
Design of self-checking unidirectional combinational circuits with low area overhead
(1996)
Saposhnikov, Va. V.
;
Morosov, Andrej
;
Saposhnikov, Vl. V.
;
Gössel, Michael
Necessary and Sufficient Conditions for the Existence of Self-Checking Circuits ba Use of Complementary Circuits
(2004)
Saposhnikov, V. V.
;
Saposhnikov, Vl. V.
;
Morozov, Alexei
;
Gössel, Michael
A parity-preserving multi-input signature analyzer and it application for concurrent checking and BIST
(1996)
Gössel, Michael
;
Sogomonyan, Egor S.
Design of self dual fault-secure combinational circuits
(1997)
Morosov, Andrej
;
Saposhnikov, Vl. V.
;
Saposhnikov, V. V.
;
Gössel, Michael
Self-dual duplication for error detection
(1998)
Saposhnikov, Vl. V.
;
Saposhnikov, V. V.
;
Dimitriev, Alexej
;
Gössel, Michael
A structural approach for space compaction for sequential circuits
(1999)
Seuring, Markus
;
Gössel, Michael
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