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Gössel, Michael
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Design for testability (DFT)
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test response compaction
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Institut für Informatik und Computational Science
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Self-dual multi output combinational circuits with output data compaction
(1997)
Saposhnikov, Vl. V.
;
Moshanin, Vl.
;
Saposhnikov, V. V.
;
Gössel, Michael
A structural approach for space compaction for concurrent checking and BIST
(1997)
Seuring, Markus
;
Gössel, Michael
;
Sogomonyan, Egor S.
On-line Test auf der Grundlage eines die Parität erhaltenden Signaturanalysators
(1998)
Gössel, Michael
;
Sogomonyan, Egor S.
Self-Checking circuits with unidiectionally independent outputs
(1998)
Morosov, Andrej
;
Saposhnikov, V. V.
;
Gössel, Michael
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