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- Design for testability (DFT) (1)
- X-masking (1)
- X-values (1)
- test response compaction (1)
Institut
Grundlagen digitaler Systeme
(2005)
In this paper a self-checking carry select adder is proposed. The duplicated adder blocks which are inherent to a carry select adder without error detection are checked modulo 3. Compared to a carry select adder without error detection the delay of the MSB of the sum of the proposed adder does not increase. Compared to a self-checking duplicated carry select adder the area is reduced by 20%. No restrictions are imposed on the design of the adder blocks