A versatile detector for total fluorescence and electron yield experiments
- The combination of a non-coated silicon photodiode with electron repelling meshes makes a versatile detector for total fluorescence yield and electron yield techniques highly suitable for x-ray absorption spectroscopy. In particular, a copper mesh with a bias voltage allows to suppress or transmit the electron yield signal. The performance of this detection scheme has been characterized by near edge x-ray absorption fine structure studies of thermal oxidized silicon and sapphire. The results show that the new detector probes both electron yield and for a bias voltage exceeding the maximum photon energy the total fluorescence yield.
| Author details: | Nele Thielemann-KühnORCiDGND, P. Hoffmann, Alexander FöhlischORCiDGND |
|---|---|
| DOI: | https://doi.org/10.1063/1.4754126 |
| ISSN: | 0034-6748 |
| Title of parent work (English): | Review of scientific instruments : a monthly journal devoted to scientific instruments, apparatus, and techniques |
| Publisher: | American Institute of Physics |
| Place of publishing: | Melville |
| Publication type: | Article |
| Language: | English |
| Year of first publication: | 2012 |
| Publication year: | 2012 |
| Release date: | 2017/03/26 |
| Volume: | 83 |
| Issue: | 9 |
| Number of pages: | 3 |
| Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
| Peer review: | Referiert |
