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Time-resolved X-ray diffraction study of the structural dynamics in an epitaxial ferroelectric thin Pb(Zr0.2Ti0.8)O-3 film induced by sub-coercive fields

  • The electric field-dependence of structural dynamics in a tetragonal ferroelectric lead zirconate titanate thin film is investigated under subcoercive and above-coercive fields using time-resolved X-ray diffraction. The domain nucleation and growth are monitored in real time during the application of an external field to the prepoled thin film capacitor. We propose the observed broadening of the in-plane peak width of the symmetric 002 Bragg reflection as an indicator of the domain disorder and discuss the processes that change the measured peak intensity. Subcoercive field switching results in remnant disordered domain configurations. Published under license by AIP Publishing.

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Author details:Christelle Larodia Tchoumba KwamenORCiDGND, Matthias RössleORCiD, Wolfram LeitenbergerGND, Marin AlexeORCiDGND, Matias BargheerORCiDGND
DOI:https://doi.org/10.1063/1.5084104
ISSN:0003-6951
ISSN:1077-3118
Title of parent work (English):Applied physics letters
Publisher:American Institute of Physics
Place of publishing:Melville
Publication type:Article
Language:English
Date of first publication:2019/04/26
Publication year:2019
Release date:2021/03/01
Volume:114
Issue:16
Number of pages:5
Funding institution:BMBFFederal Ministry of Education & Research (BMBF) [05K16IPA]; Royal SocietyRoyal Society of London; EPSRC (UK)Engineering & Physical Sciences Research Council (EPSRC) [EP/P031544/1, EP/P025803/1]
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie
DDC classification:5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik
Peer review:Referiert
Publishing method:Open Access / Green Open-Access
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