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Reliable operation for 14 500 h of a wavelength-stabilized Diode Laser System on a Microoptical Bench at 671 nm

  • Reliability tests for wavelength-stabilized compact diode laser systems emitting at 671 nm are presented. The devices were mounted on microoptical benches with the dimensions of 13 mm x 4 mm. Reflecting Bragg gratings were used for wavelength stabilization and emission width narrowing. The reliability tests were performed at 25 degrees C and at an output power up to 10 mW per micrometer stripe width of the gain medium. Reliable operation could be demonstrated over a test time up to 14 500 h at an output power up to 1.0 W. Environmental tests using random vibrations with acceleration up to 29 g were performed without deterioration of the devices.

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Author:Bernd Sumpf, Martin Maiwald, Andre Muller, Arnim Ginolas, Karl Haeusler, Goetz Erbert, Guenther Traenkle
ISSN:2156-3950 (print)
Parent Title (English):IEEE transactions on components, packaging and manufacturing technology
Publisher:Inst. of Electr. and Electronics Engineers
Place of publication:Piscataway
Document Type:Article
Year of first Publication:2012
Year of Completion:2012
Release Date:2017/03/26
Tag:High-power lasers; Raman spectroscopy; laser resonators; reliability; semiconductor lasers
First Page:116
Last Page:121
Funder:Federal Ministry of Education and Research (BMBF) [16SV2332]
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Chemie
Peer Review:Referiert