TY  - JOUR
A1  - Sumpf, Bernd
A1  - Maiwald, Martin
A1  - Muller, Andre
A1  - Ginolas, Arnim
A1  - Haeusler, Karl
A1  - Erbert, Goetz
A1  - Traenkle, Guenther
T1  - Reliable operation for 14 500 h of a wavelength-stabilized Diode Laser System on a Microoptical Bench at 671 nm
T2  - IEEE transactions on components, packaging and manufacturing technology
N2  - Reliability tests for wavelength-stabilized compact diode laser systems emitting at 671 nm are presented. The devices were mounted on microoptical benches with the dimensions of 13 mm x 4 mm. Reflecting Bragg gratings were used for wavelength stabilization and emission width narrowing. The reliability tests were performed at 25 degrees C and at an output power up to 10 mW per micrometer stripe width of the gain medium. Reliable operation could be demonstrated over a test time up to 14 500 h at an output power up to 1.0 W. Environmental tests using random vibrations with acceleration up to 29 g were performed without deterioration of the devices.
KW  - High-power lasers
KW  - laser resonators
KW  - Raman spectroscopy
KW  - reliability
KW  - semiconductor lasers
Y1  - 2012
UR  - https://publishup.uni-potsdam.de/frontdoor/index/index/docId/36334
SN  - 2156-3950
VL  - 2
IS  - 1
SP  - 116
EP  - 121
PB  - Inst. of Electr. and Electronics Engineers
CY  - Piscataway
ER  -