Reliable operation for 14 500 h of a wavelength-stabilized Diode Laser System on a Microoptical Bench at 671 nm
- Reliability tests for wavelength-stabilized compact diode laser systems emitting at 671 nm are presented. The devices were mounted on microoptical benches with the dimensions of 13 mm x 4 mm. Reflecting Bragg gratings were used for wavelength stabilization and emission width narrowing. The reliability tests were performed at 25 degrees C and at an output power up to 10 mW per micrometer stripe width of the gain medium. Reliable operation could be demonstrated over a test time up to 14 500 h at an output power up to 1.0 W. Environmental tests using random vibrations with acceleration up to 29 g were performed without deterioration of the devices.
| Verfasserangaben: | Bernd Sumpf, Martin Maiwald, Andre Muller, Arnim Ginolas, Karl Haeusler, Goetz Erbert, Guenther Traenkle |
|---|---|
| DOI: | https://doi.org/10.1109/TCPMT.2011.2171342 |
| ISSN: | 2156-3950 |
| Titel des übergeordneten Werks (Englisch): | IEEE transactions on components, packaging and manufacturing technology |
| Verlag: | Inst. of Electr. and Electronics Engineers |
| Verlagsort: | Piscataway |
| Publikationstyp: | Wissenschaftlicher Artikel |
| Sprache: | Englisch |
| Jahr der Erstveröffentlichung: | 2012 |
| Erscheinungsjahr: | 2012 |
| Datum der Freischaltung: | 26.03.2017 |
| Freies Schlagwort / Tag: | High-power lasers; Raman spectroscopy; laser resonators; reliability; semiconductor lasers |
| Band: | 2 |
| Ausgabe: | 1 |
| Seitenanzahl: | 6 |
| Erste Seite: | 116 |
| Letzte Seite: | 121 |
| Fördernde Institution: | Federal Ministry of Education and Research (BMBF) [16SV2332] |
| Organisationseinheiten: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Chemie |
| Peer Review: | Referiert |
