Use of decoupling cells for mitigation of SET effects in CMOS combinational gates
- This paper investigates the applicability of CMOS decoupling cells for mitigating the Single Event Transient (SET) effects in standard combinational gates. The concept is based on the insertion of two decoupling cells between the gate's output and the power/ground terminals. To verify the proposed hardening approach, extensive SPICE simulations have been performed with standard combinational cells designed in IHP's 130 nm bulk CMOS technology. Obtained simulation results have shown that the insertion of decoupling cells results in the increase of the gate's critical charge, thus reducing the gate's soft error rate (SER). Moreover, the decoupling cells facilitate the suppression of SET pulses propagating through the gate. It has been shown that the decoupling cells may be a competitive alternative to gate upsizing and gate duplication for hardening the gates with lower critical charge and multiple (3 or 4) inputs, as well as for filtering the short SET pulses induced by low-LET particles.
Author details: | Marko AndjelkovicORCiDGND, Milan Babic, Yuanqing Li, Oliver SchrapeORCiDGND, Miloš KrstićORCiDGND, Rolf Kraemer |
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DOI: | https://doi.org/10.1109/ICECS.2018.8617996 |
ISBN: | 978-1-5386-9562-3 |
Title of parent work (English): | 2018 25th IEEE International Conference on Electronics, Circuits and Systems (ICECS) |
Publisher: | IEEE |
Place of publishing: | New York |
Publication type: | Other |
Language: | English |
Date of first publication: | 2019/01/21 |
Publication year: | 2019 |
Release date: | 2022/02/28 |
Tag: | CMOS technology; SET effects; combinational logic; decoupling cells; radiation hardening |
Number of pages: | 4 |
First page: | 361 |
Last Page: | 364 |
Funding institution: | German Research Foundation DFGGerman Research Foundation (DFG) [KR 3576/29-1] |
Organizational units: | Digital Engineering Fakultät / Hasso-Plattner-Institut für Digital Engineering GmbH |
DDC classification: | 0 Informatik, Informationswissenschaft, allgemeine Werke / 00 Informatik, Wissen, Systeme / 000 Informatik, Informationswissenschaft, allgemeine Werke |
Peer review: | Referiert |