Time-resolved measurement of space-charge evolution in dielectric films or slabs by means of repeatable laser-induced pressure pulses
- A new variant of the Laser-Induced Pressure-Pulse (LIPP) method for repeatable, time-resolved space-charge profile measurements is proposed and demonstrated. Automated deposition of a fresh laser-target film before each illumination leads to good repeatability of the LIPP and thus allows for the detection of time-resolved changes in the space-charge distribution over many hours. We describe and discuss the experimental setup and its features, compare the repeatability of the LIPP measurements on the same sample without and with re-preparation of the test cell, and present the time-resolved evolution of the space-charge profile in a two-layer arrangement of a silicone-grease and a silicone-elastomer film as an example. Finally, the temperature dependence of the space-charge evolution during polarization under high voltage and during depolarization in short circuit is shown. Possible uses and future developments of the new LIPP approach are also discussed.
Author details: | Simon SpelzhausenORCiDGND, Mario-Rafael IonianORCiD, Reimund GerhardORCiDGND, Ronald PlathORCiDGND |
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DOI: | https://doi.org/10.1063/1.5142443 |
ISSN: | 0034-6748 |
ISSN: | 1089-7623 |
Pubmed ID: | https://pubmed.ncbi.nlm.nih.gov/32486702 |
Title of parent work (English): | Review of scientific instruments : a monthly journal devoted to scientific instruments, apparatus, and techniques |
Publisher: | American Institute of Physics |
Place of publishing: | Melville |
Publication type: | Article |
Language: | English |
Date of first publication: | 2020/05/19 |
Publication year: | 2020 |
Release date: | 2023/03/30 |
Volume: | 91 |
Issue: | 5 |
Article number: | 055105 |
Number of pages: | 7 |
Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
DDC classification: | 5 Naturwissenschaften und Mathematik / 53 Physik / 530 Physik |
6 Technik, Medizin, angewandte Wissenschaften / 62 Ingenieurwissenschaften / 620 Ingenieurwissenschaften und zugeordnete Tätigkeiten | |
Peer review: | Referiert |