• search hit 19 of 400
Back to Result List

A survey on deep learning for patent analysis

  • Patent document collections are an immense source of knowledge for research and innovation communities worldwide. The rapid growth of the number of patent documents poses an enormous challenge for retrieving and analyzing information from this source in an effective manner. Based on deep learning methods for natural language processing, novel approaches have been developed in the field of patent analysis. The goal of these approaches is to reduce costs by automating tasks that previously only domain experts could solve. In this article, we provide a comprehensive survey of the application of deep learning for patent analysis. We summarize the state-of-the-art techniques and describe how they are applied to various tasks in the patent domain. In a detailed discussion, we categorize 40 papers based on the dataset, the representation, and the deep learning architecture that were used, as well as the patent analysis task that was targeted. With our survey, we aim to foster future research at the intersection of patent analysis and deepPatent document collections are an immense source of knowledge for research and innovation communities worldwide. The rapid growth of the number of patent documents poses an enormous challenge for retrieving and analyzing information from this source in an effective manner. Based on deep learning methods for natural language processing, novel approaches have been developed in the field of patent analysis. The goal of these approaches is to reduce costs by automating tasks that previously only domain experts could solve. In this article, we provide a comprehensive survey of the application of deep learning for patent analysis. We summarize the state-of-the-art techniques and describe how they are applied to various tasks in the patent domain. In a detailed discussion, we categorize 40 papers based on the dataset, the representation, and the deep learning architecture that were used, as well as the patent analysis task that was targeted. With our survey, we aim to foster future research at the intersection of patent analysis and deep learning and we conclude by listing promising paths for future work.show moreshow less

Export metadata

Additional Services

Search Google Scholar Statistics
Metadaten
Author details:Ralf KrestelORCiDGND, Renukswamy Chikkamath, Christoph Hewel, Julian RischGND
DOI:https://doi.org/10.1016/j.wpi.2021.102035
ISSN:0172-2190
ISSN:1874-690X
Title of parent work (English):World patent information
Publisher:Elsevier
Place of publishing:Amsterdam
Publication type:Article
Language:English
Date of first publication:2021/03/30
Publication year:2021
Release date:2023/12/07
Tag:deep learning; natural language processing; patent analysis; text mining
Volume:65
Article number:102035
Number of pages:13
Organizational units:Digital Engineering Fakultät / Hasso-Plattner-Institut für Digital Engineering GmbH
DDC classification:0 Informatik, Informationswissenschaft, allgemeine Werke / 00 Informatik, Wissen, Systeme / 000 Informatik, Informationswissenschaft, allgemeine Werke
Peer review:Referiert
Accept ✔
This website uses technically necessary session cookies. By continuing to use the website, you agree to this. You can find our privacy policy here.