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(13)
Author
Pietsch, Ullrich
(13)
Darowski, Nora
(4)
Stahn, Jochen
(3)
Forchel, Alfred
(2)
Geue, Thomas
(2)
Göbel, H.
(2)
Hub, W.
(2)
Lübbert, Daniel
(2)
Stömmer, Ralph
(2)
Wang, K. H.
(2)
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1998 (13)
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Article
(13)
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English
(13)
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(13)
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Institut für Physik und Astronomie
(13)
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Nondestructive analysis of a lateral GaAs nanostructure buried under AlGaAs using conventional high resolution and grazing incidence X-ray diffraction
(1998)
Darowski, Nora
;
Pietsch, Ullrich
;
Zeimer, Ute
;
Smirnitzki, V.
;
Bugge, F.
Comparative studies of fractal parameters of Si(100) surfaces measured by X-ray scattering and atomic force microscopy
(1998)
Stömmer, Ralph
;
Martin, C. R.
;
Geue, Thomas
;
Göbel, H.
;
Hub, W.
;
Pietsch, Ullrich
X-ray scattering from silicon surfaces
(1998)
Stömmer, Ralph
;
Göbel, H.
;
Hub, W.
;
Pietsch, Ullrich
In-plane strain and strain relaxation in laterally patterned Si/SiGe quantum dots and wire arrays
(1998)
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
;
Zhuang, Y.
;
Zerlauth, S.
;
Bauer, Günther
Electric field induced electron density response of GaAs and ZnSe
(1998)
Stahn, Jochen
;
Pucher, Andreas
;
Geue, Thomas
;
Daniel, A.
;
Pietsch, Ullrich
Influence of the deposition rate on the structure of thin metal layers
(1998)
Haier, P.
;
Herrmann, B. A.
;
Esser, N.
;
Pietsch, Ullrich
;
Lüders, K.
;
Richter, W.
X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures
(1998)
Darowski, Nora
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Shen, W.
;
Kycia, S.
X-ray and transport characterization of an Esaki-Tsu superlattice device
(1998)
Grenzer, Jörg
;
Schomburg, E.
;
Lingott, I.
;
Ignotov, A. a.
;
Renk, K. F.
;
Pietsch, Ullrich
;
Rose, Dirk
;
Zeimer, Ute
;
Melzer, B. J.
;
Ivanov, S.
;
Schaposchnikov, S.
;
Kop'ev, P. S.
;
Pavel'ev, D. G.
;
Koschurinov, Yu.
Investigation of strain relaxation in GaInAs/GaAs superlattices by x-ray diffuse scattering
(1998)
Ulyanenkov, A.
;
Klemradt, U.
;
Pietsch, Ullrich
Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction
(1998)
Darowski, Nora
;
Paschke, K.
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Lübbert, Daniel
;
Baumbach, Tilo
Investigation of the vertical molecular exchange in a complex organic multilayer system
(1998)
Englisch, Uwe
;
Penacorada, Florencio
;
Samoilenko, I.
;
Pietsch, Ullrich
Critical pionts in a crystal an procrystal
(1998)
Tsirelson, Vladimir G.
;
Abramov, Yury Fedorovich
;
Zavodnik, Valerie E.
;
Stash, Adam I.
;
Belokoneva, Elena L.
;
Stahn, Jochen
;
Pietsch, Ullrich
;
Feil, Dirk
Comparison of theoretical and experimental structure amplitudes of GaAs
(1998)
Stahn, Jochen
;
Möhle, Marcus
;
Pietsch, Ullrich
1
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13
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