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(13)
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Pietsch, Ullrich (13)
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1998 (13)
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Article
(13)
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English
(13)
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(13)
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Institut für Physik und Astronomie (13)
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In-plane strain and strain relaxation in laterally patterned Si/SiGe quantum dots and wire arrays
(1998)
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
;
Zhuang, Y.
;
Zerlauth, S.
;
Bauer, Günther
Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction
(1998)
Darowski, Nora
;
Paschke, K.
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Lübbert, Daniel
;
Baumbach, Tilo
X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures
(1998)
Darowski, Nora
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Shen, W.
;
Kycia, S.
Nondestructive analysis of a lateral GaAs nanostructure buried under AlGaAs using conventional high resolution and grazing incidence X-ray diffraction
(1998)
Darowski, Nora
;
Pietsch, Ullrich
;
Zeimer, Ute
;
Smirnitzki, V.
;
Bugge, F.
Investigation of the vertical molecular exchange in a complex organic multilayer system
(1998)
Englisch, Uwe
;
Penacorada, Florencio
;
Samoilenko, I.
;
Pietsch, Ullrich
X-ray and transport characterization of an Esaki-Tsu superlattice device
(1998)
Grenzer, Jörg
;
Schomburg, E.
;
Lingott, I.
;
Ignotov, A. a.
;
Renk, K. F.
;
Pietsch, Ullrich
;
Rose, Dirk
;
Zeimer, Ute
;
Melzer, B. J.
;
Ivanov, S.
;
Schaposchnikov, S.
;
Kop'ev, P. S.
;
Pavel'ev, D. G.
;
Koschurinov, Yu.
Influence of the deposition rate on the structure of thin metal layers
(1998)
Haier, P.
;
Herrmann, B. A.
;
Esser, N.
;
Pietsch, Ullrich
;
Lüders, K.
;
Richter, W.
Comparison of theoretical and experimental structure amplitudes of GaAs
(1998)
Stahn, Jochen
;
Möhle, Marcus
;
Pietsch, Ullrich
Electric field induced electron density response of GaAs and ZnSe
(1998)
Stahn, Jochen
;
Pucher, Andreas
;
Geue, Thomas
;
Daniel, A.
;
Pietsch, Ullrich
X-ray scattering from silicon surfaces
(1998)
Stömmer, Ralph
;
Göbel, H.
;
Hub, W.
;
Pietsch, Ullrich
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