3D high-resolution mapping of polarization profiles in thin poly(vinylidenefluoride-trifluoroethylene) (PVDF- TrFE) films using two thermal techniques
- In this paper, two non-destructive thermal methods are used in order to determine, with a high degree of accuracy, three-dimensional polarization distributions in thin films (12 mu m) of poly(vinylidenefluoride- trifluoroethylene) (PVDF-TrFE). The techniques are the frequency-domain Focused Laser Intensity Modulation Method (FLIMM) and time-domain Thermal-Pulse Tomography (TPT). Samples were first metalized with grid-shaped electrode and poled. 3D polarization mapping yielded profiles which reproduce the electrode-grid shape. The polarization is not uniform across the sample thickness. Significant polarization values are found only at depths beyond 0.5 mu m from the sample surface. Both methods provide similar results, TPT method being faster, whereas the FLIMM technique has a better lateral resolution.
| Verfasserangaben: | Cong Duc Pham, Anca Petre, Laurent Berquez, Rosaura Flores SuárezGND, Axel MellingerORCiDGND, Werner WirgesORCiD, Reimund GerhardORCiDGND |
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| URL: | http://ieeexplore.ieee.org/servlet/opac?punumber=94 |
| DOI: | https://doi.org/10.1109/TDEI.2009.5128505 |
| ISSN: | 1070-9878 |
| Publikationstyp: | Wissenschaftlicher Artikel |
| Sprache: | Englisch |
| Jahr der Erstveröffentlichung: | 2009 |
| Erscheinungsjahr: | 2009 |
| Datum der Freischaltung: | 25.03.2017 |
| Quelle: | IEEE Transactions on dielectrics and electrical insulation. - ISSN 1070-9878. - 16 (2009), 3, S. 676 - 681 |
| Organisationseinheiten: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
| Peer Review: | Referiert |
