Flexural strike-slip basins
- Strike-slip faults are classically associated with pull-apart basins where continental crust is thinned between two laterally offset fault segments. We propose a subsidence mechanism to explain the formation of a new type of basin where no substantial segment offset or synstrike-slip thinning is observed. Such "flexural strike-slip basins" form due to a sediment load creating accommodation space by bending the lithosphere. We use a two-way coupling between the geodynamic code ASPECT and surface-processes code FastScape to show that flexural strike-slip basins emerge if sediment is deposited on thin lithosphere close to a strike slip fault. These conditions were met at the Andaman Basin Central fault (Andaman Sea, Indian Ocean), where seismic reflection data provide evidence of a laterally extensive flexural basin with a depocenter located parallel to the strike-slip fault trace.
Verfasserangaben: | Derek NeuharthORCiDGND, Sascha BruneORCiDGND, Anne GlerumORCiD, Chris K. MorleyORCiDGND, Xiaoping YuanORCiD, Jean BraunORCiDGND |
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DOI: | https://doi.org/10.1130/G49351.1 |
ISSN: | 0091-7613 |
ISSN: | 1943-2682 |
Titel des übergeordneten Werks (Englisch): | Geology : a venture in earth science reporting / the Geological Society of America |
Verlag: | American Institute of Physics |
Verlagsort: | Boulder |
Publikationstyp: | Wissenschaftlicher Artikel |
Sprache: | Englisch |
Datum der Erstveröffentlichung: | 07.12.2021 |
Erscheinungsjahr: | 2021 |
Datum der Freischaltung: | 15.03.2024 |
Band: | 50 |
Ausgabe: | 3 |
Seitenanzahl: | 5 |
Erste Seite: | 361 |
Letzte Seite: | 365 |
Fördernde Institution: | Helmholtz Young Investigators Group CRYSTALS [VH-NG-1132]; U.S. National; Science Foundation [EAR-0949446, EAR-1550901]; North-German; Supercomputing Alliance (HLRN) |
Organisationseinheiten: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Geowissenschaften |
DDC-Klassifikation: | 5 Naturwissenschaften und Mathematik / 55 Geowissenschaften, Geologie / 550 Geowissenschaften |
Peer Review: | Referiert |