Laterally constrained inversion (LCI) of multi-configuration EMI data with tunable sharpness
- Frequency-domain electromagnetic (FDEM) data are commonly inverted to characterize subsurface geoelectrical properties using smoothness constraints in 1D inversion schemes assuming a layered medium.
Smoothness constraints are suitable for imaging gradual transitions of subsurface geoelectrical properties caused, for example, by varying sand, clay, or fluid content. However, such inversion approaches are limited in characterizing sharp interfaces. Alternative regularizations based on the minimum gradient support (MGS) stabilizers can, instead, be used to promote results with different levels of smoothness/sharpness selected by simply acting on the so-called focusing parameter.
The MGS regularization has been implemented for different kinds of geophysical data inversion strategies. However, concerning FDEM data, the MGS regularization has only been implemented for vertically constrained inversion (VCI) approaches but not for laterally constrained inversion (LCI) approaches.
We present a novel LCI approach for FDEM data using theFrequency-domain electromagnetic (FDEM) data are commonly inverted to characterize subsurface geoelectrical properties using smoothness constraints in 1D inversion schemes assuming a layered medium.
Smoothness constraints are suitable for imaging gradual transitions of subsurface geoelectrical properties caused, for example, by varying sand, clay, or fluid content. However, such inversion approaches are limited in characterizing sharp interfaces. Alternative regularizations based on the minimum gradient support (MGS) stabilizers can, instead, be used to promote results with different levels of smoothness/sharpness selected by simply acting on the so-called focusing parameter.
The MGS regularization has been implemented for different kinds of geophysical data inversion strategies. However, concerning FDEM data, the MGS regularization has only been implemented for vertically constrained inversion (VCI) approaches but not for laterally constrained inversion (LCI) approaches.
We present a novel LCI approach for FDEM data using the MGS regularization for the vertical and lateral direction. Using synthetic and field data examples, we demonstrate that our approach can efficiently and automatically provide a set of model solutions characterized by different levels of sharpness and variable lateral consistencies.
In terms of data misfit, the obtained set of solutions contains equivalent models allowing us also to investigate the non-uniqueness of FDEM data inversion.…
Author details: | Tim KloseORCiD, Julien GuillemoteauORCiDGND, Giulio VignoliORCiD, Jens TronickeORCiDGND |
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DOI: | https://doi.org/10.1016/j.jappgeo.2021.104519 |
ISSN: | 0926-9851 |
Title of parent work (English): | Journal of applied geophysics |
Publisher: | Elsevier |
Place of publishing: | Amsterdam |
Publication type: | Article |
Language: | English |
Year of first publication: | 2022 |
Publication year: | 2022 |
Release date: | 2024/04/11 |
Tag: | frequency-domain electromagnetics; laterally constrained inversion; minimum gradient support regularization; peat characterization |
Volume: | 196 |
Article number: | 104519 |
Number of pages: | 9 |
Funding institution: | Deutsche Forschungsgemeinschaft (DFG)German Research Foundation (DFG) [418056756]; initiative POR-FESR Sardegna 2014-2020, Asse I Azione I.1.3 "Creare opportunita di lavoro favorendo la competitivita delle imprese" - project: "Tecnologie di CARatterizzazione Monitoraggio e Analisi per il ripristino e la bonifica (CARMA)" |
Organizational units: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Geowissenschaften |
DDC classification: | 5 Naturwissenschaften und Mathematik / 55 Geowissenschaften, Geologie / 550 Geowissenschaften |
6 Technik, Medizin, angewandte Wissenschaften / 62 Ingenieurwissenschaften / 620 Ingenieurwissenschaften und zugeordnete Tätigkeiten | |
6 Technik, Medizin, angewandte Wissenschaften / 66 Chemische Verfahrenstechnik / 660 Chemische Verfahrenstechnik | |
Peer review: | Referiert |