Structural characterization of epitaxial Fe/Cr multilayers using anomalous x-ray scattering and neutron reflectivity
- The interface structure of epitaxial Fe/Cr multilayers was studied using anomalous X-ray and neutron reflectivity. The analysis of X-ray reflectivity at three different energies provided a reliable information about the interface roughnesses. It is found that the Cr-on-Fc interface is more diffused as compared to the Fe-on-Cr interface and that the roughness exhibits a significant increase with increasing depth. The magnetic roughness, as determined from neutron reflectivity, is lower than the geometrical roughness, in conformity with the behavior of a number of magnetic thin films and multilayers. (C) 2004 Elsevier B.V. All rights reserved
| Verfasserangaben: | Ullrich Pietsch, Amod Gupta, A. Paul, C. Meneghini, K. Mibu, S. Maddalena, S. Dal Toe, G. Principi |
|---|---|
| Publikationstyp: | Wissenschaftlicher Artikel |
| Sprache: | Englisch |
| Jahr der Erstveröffentlichung: | 2004 |
| Erscheinungsjahr: | 2004 |
| Datum der Freischaltung: | 24.03.2017 |
| Quelle: | Journal of Magnetism and Magnetic Materials. - 272 (2004), 2, S. 1219 - 1220 |
| Organisationseinheiten: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
| Peer Review: | Referiert |
| Name der Einrichtung zum Zeitpunkt der Publikation: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik |
