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An Improved Formula of Fundamental Resonance Frequency of a Layered Half-Space Model Used in H/V Ratio Technique

  • The resonance frequency of the transmission response in layered half-space model is important in the study of site effect because it is the frequency where the shake-ability of the ground is enhanced significantly. In practice, it is often determined by the H/V ratio technique in which the peak frequency of recorded H/V spectral ratio is interpreted as the resonance frequency. Despite of its importance, there has not been any formula of the resonance frequency of the layered half-space structure. In this paper, a simple approximate formula of the fundamental resonance frequency is presented after an exact formula in explicit form of the response function of vertically SH incident wave is obtained. The formula is in similar form with the one used in H/V ratio technique but it reflects several major effects of the model to the resonance frequency such as the arrangement of layers, the impedance contrast between layers and the half-space. Therefore, it could be considered as an improved formula used in H/V ratio technique. The formulaThe resonance frequency of the transmission response in layered half-space model is important in the study of site effect because it is the frequency where the shake-ability of the ground is enhanced significantly. In practice, it is often determined by the H/V ratio technique in which the peak frequency of recorded H/V spectral ratio is interpreted as the resonance frequency. Despite of its importance, there has not been any formula of the resonance frequency of the layered half-space structure. In this paper, a simple approximate formula of the fundamental resonance frequency is presented after an exact formula in explicit form of the response function of vertically SH incident wave is obtained. The formula is in similar form with the one used in H/V ratio technique but it reflects several major effects of the model to the resonance frequency such as the arrangement of layers, the impedance contrast between layers and the half-space. Therefore, it could be considered as an improved formula used in H/V ratio technique. The formula also reflects the consistency between two approaches of the H/V ratio technique based on SH body waves or Rayleigh surface waves on the peak frequency under high impedance contrast condition. This formula is in explicit form and, therefore, may be used in the direct and inverse problem efficiently. A numerical illustration of the improved formula for an actual layered half-space model already investigated by H/V ratio technique is presented to demonstrate its new features and its improvement to the currently used formula.show moreshow less

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Author details: Tran Thanh Tuan, Pham Chi Vinh, Matthias OhrnbergerORCiDGND, Peter Malischewsky, Abdelkrim Aoudia
DOI:https://doi.org/10.1007/s00024-016-1313-0
ISSN:0033-4553
ISSN:1420-9136
Title of parent work (English):Pure and applied geophysics
Publisher:Springer
Place of publishing:Basel
Publication type:Article
Language:English
Year of first publication:2016
Publication year:2016
Release date:2020/03/22
Tag:H/V ratio technique; Orthotropy; Quarter-wavelength principle; Response function; SH waves
Volume:173
Number of pages:10
First page:2803
Last Page:2812
Funding institution:Vietnam National Foundation for Science and Technology Development (NAFOSTED) [107.02-2015.09]; Generali
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Geowissenschaften
Peer review:Referiert
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