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X-ray grazing-incidence study of inhomogeneous strain relaxation in Si/SiGe wires

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Author details:Ullrich Pietsch, A. Hesse, Y. Zhuang, Vaclav Holý, Jochen Stangl, S. Zerlauth, F. Schaffler, Günther Bauer
ISSN:0168-583X
Publication type:Article
Language:English
Year of first publication:2003
Publication year:2003
Release date:2017/03/24
Source:Nuclear instruments and methods in physics research : Section B, Beam interactions with materials and atoms. - ISSN 0168-583X. - 200 C (2003), S. 267 - 272
Organizational units:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie
Peer review:Referiert
Institution name at the time of the publication:Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik
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