Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction
- Using ultrafast X-ray diffraction, we study the coherent picosecond lattice dynamics of photoexcited thin films in the two limiting cases, where the photoinduced stress profile decays on a length scale larger and smaller than the film thickness. We solve a unifying analytical model of the strain propagation for acoustic impedance-matched opaque films on a semi-infinite transparent substrate, showing that the lattice dynamics essentially depend on two parameters: One for the spatial profile and one for the amplitude of the strain. We illustrate the results by comparison with high-quality ultrafast X-ray diffraction data of SrRuO3 films on SrTiO3 substrates. (C) 2014 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.
| Verfasserangaben: | Daniel Schick, Marc HerzogORCiDGND, Andre BojahrGND, Wolfram LeitenbergerGND, Andreas Hertwig, Roman Shayduk, Matias BargheerORCiDGND |
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| DOI: | https://doi.org/10.1063/1.4901228 |
| ISSN: | 2329-7778 |
| Titel des übergeordneten Werks (Englisch): | Structural dynamics |
| Verlag: | American Institute of Physics |
| Verlagsort: | Melville |
| Publikationstyp: | Wissenschaftlicher Artikel |
| Sprache: | Englisch |
| Jahr der Erstveröffentlichung: | 2014 |
| Erscheinungsjahr: | 2014 |
| Datum der Freischaltung: | 27.03.2017 |
| Band: | 1 |
| Ausgabe: | 6 |
| Seitenanzahl: | 13 |
| Fördernde Institution: | BMBF [05K10IP1]; DFG [BA2281/3-1]; Leibnitz graduate school "Dynamics in new Light" |
| Organisationseinheiten: | Mathematisch-Naturwissenschaftliche Fakultät / Institut für Physik und Astronomie |
| Peer Review: | Referiert |
