## Institut für Physik und Astronomie

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A detailed theoretical investigation of the reflection of an atomic de Broglie wave at an evanescent wave mirror is presented. The classical and the semiclassical descriptions of the reflection process are reviewed, and a full wave-mechanical approach based on the analytical soution of the corresponding Schrödinger equation is presented. The phase shift at reflection is calculated exactly and interpreted in terms of instantaneous reflection of the atom at an effective mirror. Besides the semiclassical regime of reflection describable by the WKB method, a pure quantum regime of reflection is identified in the limit where the incident de Broglie wavelength is large compared to the evanescent wave decay length.

A novel atomic beam splitter, using reflection of atoms off an evanescent light wave, is investigated theoretically. The intensity or frequency of the light is modulated in order to create sidebands on the reflected de Broglie wave. The weights and phases of the various sidevands are calculated using three different approaches: the Born approximation, a semiclassical path integral approach, and a numerical solution of the time-dependent Schrdinger equation. We show how this modulated mirror could be used to build practical atomic interferometers.

We present a semiclassical perturbation method for the description of atomic diffraction by a weakly modulated potential. It proceeds in a way similar to the treatment of light diffraction by a thin phase grating, and consists in calculating the atomic wavefunction by means of action integrals along the classical trajectories of the atoms in the absence of the modulated part of the potential. The capabilities and the validity condition of the method are illustrated on the well-known case of atomic diffraction by a Gaussian standing wave. We prove that in this situation the perturbation method is equivalent to the Raman-Nath approximation, and we point out that the usually-considered Raman-Nath validity condition can lead to inaccuracies in the evaluation of the phases of the diffraction amplitudes. The method is also applied to the case of an evanescent wave reflection grating, and an analytical expression for the diffraction pattern at any incidence angle is obtained for the first time. Finally, the application of the method to other situations is briefly discussed.