Institut für Informatik und Computational Science
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In this work we consider statistical learning problems. A learning machine aims to extract information from a set of training examples such that it is able to predict the associated label on unseen examples. We consider the case where the resulting classification or regression rule is a combination of simple rules - also called base hypotheses. The so-called boosting algorithms iteratively find a weighted linear combination of base hypotheses that predict well on unseen data. We address the following issues: o The statistical learning theory framework for analyzing boosting methods. We study learning theoretic guarantees on the prediction performance on unseen examples. Recently, large margin classification techniques emerged as a practical result of the theory of generalization, in particular Boosting and Support Vector Machines. A large margin implies a good generalization performance. Hence, we analyze how large the margins in boosting are and find an improved algorithm that is able to generate the maximum margin solution. o How can boosting methods be related to mathematical optimization techniques? To analyze the properties of the resulting classification or regression rule, it is of high importance to understand whether and under which conditions boosting converges. We show that boosting can be used to solve large scale constrained optimization problems, whose solutions are well characterizable. To show this, we relate boosting methods to methods known from mathematical optimization, and derive convergence guarantees for a quite general family of boosting algorithms. o How to make Boosting noise robust? One of the problems of current boosting techniques is that they are sensitive to noise in the training sample. In order to make boosting robust, we transfer the soft margin idea from support vector learning to boosting. We develop theoretically motivated regularized algorithms that exhibit a high noise robustness. o How to adapt boosting to regression problems? Boosting methods are originally designed for classification problems. To extend the boosting idea to regression problems, we use the previous convergence results and relations to semi-infinite programming to design boosting-like algorithms for regression problems. We show that these leveraging algorithms have desirable theoretical and practical properties. o Can boosting techniques be useful in practice? The presented theoretical results are guided by simulation results either to illustrate properties of the proposed algorithms or to show that they work well in practice. We report on successful applications in a non-intrusive power monitoring system, chaotic time series analysis and a drug discovery process. --- Anmerkung: Der Autor ist Träger des von der Mathematisch-Naturwissenschaftlichen Fakultät der Universität Potsdam vergebenen Michelson-Preises für die beste Promotion des Jahres 2001/2002.
The objective of this thesis is to provide new space compaction techniques for testing or concurrent checking of digital circuits. In particular, the work focuses on the design of space compactors that achieve high compaction ratio and minimal loss of testability of the circuits. In the first part, the compactors are designed for combinational circuits based on the knowledge of the circuit structure. Several algorithms for analyzing circuit structures are introduced and discussed for the first time. The complexity of each design procedure is linear with respect to the number of gates of the circuit. Thus, the procedures are applicable to large circuits. In the second part, the first structural approach for output compaction for sequential circuits is introduced. Essentially, it enhances the first part. For the approach introduced in the third part it is assumed that the structure of the circuit and the underlying fault model are unknown. The space compaction approach requires only the knowledge of the fault-free test responses for a precomputed test set. The proposed compactor design guarantees zero-aliasing with respect to the precomputed test set.