Institut für Informatik und Computational Science
Refine
Has Fulltext
- no (1)
Year of publication
- 2020 (1)
Document Type
- Article (1) (remove)
Language
- English (1)
Is part of the Bibliography
- yes (1)
Keywords
- Double cell upsets (DCUs) (1) (remove)
Institute
A triple modular redundancy (TMR) based design technique for double cell upsets (DCUs) mitigation is investigated in this paper. This technique adds three extra self-voter circuits into a traditional TMR structure to enable the enhanced error correction capability. Fault-injection simulations show that the soft error rate (SER) of the proposed technique is lower than 3% of that of TMR. The implementation of this proposed technique is compatible with the automatic digital design flow, and its applicability and performance are evaluated on an FIFO circuit.