Institut für Informatik und Computational Science
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In this paper, an asynchronous design for soft error detection and correction in combinational and sequential circuits is presented. The proposed architecture is called Asynchronous Full Error Detection and Correction (AFEDC). A custom design flow with integrated commercial EDA tools generates the AFEDC using the asynchronous bundled-data design style. The AFEDC relies on an Error Detection Circuit (EDC) for protecting the combinational logic and fault-tolerant latches for protecting the sequential logic. The EDC can be implemented using different detection methods. For this work, two boundary variants are considered, the Full Duplication with Comparison (FDC) and the Partial Duplication with Parity Prediction (PDPP). The AFEDC architecture can handle single events and timing faults of arbitrarily long duration as well as the synchronous FEDC, but additionally can address known metastability issues of the FEDC and other similar synchronous architectures and provide a more practical solution for handling the error recovery process. Two case studies are developed, a carry look-ahead adder and a pipelined non-restoring array divider. Results show that the AFEDC provides equivalent fault coverage when compared to the FEDC while reducing area, ranging from 9.6% to 17.6%, and increasing energy efficiency, which can be up to 6.5%.
The objective of this thesis is to provide new space compaction techniques for testing or concurrent checking of digital circuits. In particular, the work focuses on the design of space compactors that achieve high compaction ratio and minimal loss of testability of the circuits. In the first part, the compactors are designed for combinational circuits based on the knowledge of the circuit structure. Several algorithms for analyzing circuit structures are introduced and discussed for the first time. The complexity of each design procedure is linear with respect to the number of gates of the circuit. Thus, the procedures are applicable to large circuits. In the second part, the first structural approach for output compaction for sequential circuits is introduced. Essentially, it enhances the first part. For the approach introduced in the third part it is assumed that the structure of the circuit and the underlying fault model are unknown. The space compaction approach requires only the knowledge of the fault-free test responses for a precomputed test set. The proposed compactor design guarantees zero-aliasing with respect to the precomputed test set.