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Das Heft dokumentiert die siebte Konferenz des Forschungskreises Vereinte Nationen, die am 23. und 24. Juni 2006 an der Universität Potsdam stattfand. Unter dem Titel „Ein Jahr nach dem UN-Weltgipfel 2005 – Eine Bilanz der Reformbemühungen “ widmete sich die Konferenz wichtigen strukturellen Fragen und nahm einzelne Tätigkeitsfelder der Weltorganisation in den Blick. Die aus unterschiedlichen Disziplinen und aus Wissenschaft und Praxis kommenden Referentinnen und Referenten ziehen in den Referaten eine kritische Bilanz und untersuchen, was den Erklärungen des feierlichen Weltgipfels vom September 2005 an konkreten Reformschritten gefolgt ist. In für die „Potsdamer UNO-Konferenzen“ typischer Weise wird allen Interessierten die Möglichkeit gegeben, wichtige Aspekte der aktuellen Diskussion kennenzulernen, welche vor allem die Reform der UN-Hauptorgane, Reformen im Entwicklungssystem der Vereinten Nationen und im Bereich der Überwachung von Menschenrechtsverträgen betreffen sowie Fragen der Friedenssicherung und die Beteiligung von Zivilgesellschaft und Parlamentariern. Außerdem würdigt die Broschüre schweizerische Reforminitiativen in den UN und dokumentiert die aktuelle Diskussion über die deutschsprachige UN-Forschung.
We present a new technique for uniquely identifying a single failing vector in an interval of test vectors. This technique is applicable to combinational circuits and for scan-BIST in sequential circuits with multiple scan chains. The proposed method relies on the linearity properties of the MISR and on the use of two test sequences, which are both applied to the circuit under test. The second test sequence is derived from the first in a straightforward manner and the same test pattern source is used for both test sequences. If an interval contains only a single failing vector, the algebraic analysis is guaranteed to identify it. We also show analytically that if an interval contains two failing vectors, the probability that this case is interpreted as one failing vector is very low. We present experimental results for the ISCAS benchmark circuits to demonstrate the use of the proposed method for identifying failing test vectors
Using the timing flexibility of modern automatic test equipment (ATE) test response data can be compacted without the need for additional X-masking logic. In this article the test response is compacted by several multiple input shift registers without feedback (NF-MISR). The shift registers are running on a k-times higher clock frequency than the test clock. For each test clock cycle only one out of the k outputs of each shift register is evaluated by the ATE. The impact of consecutive X values within the scan chains is reduced by a periodic permutation of the NF-MISR inputs. As a result, no additional external control signals or test set dependent control logic is required. The benefits of the proposed method are shown by the example of an implementation on a Verigy ATE. Experiments on three industrial circuits demonstrate the effectiveness of the proposed approach in comparison to a commercial DFT solution.
In this paper we consider masking of unknowns (X-values) for VLSI circuits. We present a new hierarchical method of X-masking which is a major improvement of the method proposed in [4], called WIDE1. By the method proposed, the number of observable scan cells is optimized and data volume for X-masking can be significantly reduced in comparison to WIDEL This is demonstrated for three industrial designs. In cases where all X-values have to be masked the novel approach is especially efficient.