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Courtois, Bernard
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Hellebrand, Sybille
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Rajski, Janusz
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Tarnick, Steffen
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Venkatraman, Srikanth
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1995
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Built-in test for circuits with scan based on reseeding of multiole polynomial linear feedback shift registers
(1995)
Hellebrand, Sybille
;
Rajski, Janusz
;
Tarnick, Steffen
;
Venkatraman, Srikanth
;
Courtois, Bernard
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