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(7)
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Pietsch, Ullrich (7)
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1999
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1998
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In-plane strain and strain relaxation in laterally patterned Si/SiGe quantum dots and wire arrays
(1998)
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
;
Zhuang, Y.
;
Zerlauth, S.
;
Bauer, Günther
Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction
(1998)
Darowski, Nora
;
Paschke, K.
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Lübbert, Daniel
;
Baumbach, Tilo
Lateral arrangement of self-assembled quantum dots in an SiGe/Si superlattice
(1999)
Holý, Václav
;
Stangl, Jochen
;
Zerlauth, S.
;
Bauer, Günther
;
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
In-situ characterization of strain distribution in broad-area high-power lasers under operation by high- resolution x-ray diffrcation and topography using synchrotron radiation
(1999)
Zeimer, Ute
;
Baumbach, Tilo
;
Grenzer, Jörg
;
Lübbert, Daniel
;
Mazuelas, A.
;
Pietsch, Ullrich
;
Erbert, G.
Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high-resolution x-ray diffrcation and grazing-incidence diffraction
(1999)
Zhuang, Y.
;
Holý, Václav
;
Stangl, Jochen
;
Darhuber, A.
;
Mikulik, P.
;
Zerlauth, S.
;
Schäffler, F.
;
Bauer, Günther
;
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
Strain investigation of low strained buried gratings by grazing incidence X-Ray diffraction and the theory of elasticity
(1999)
Lübbert, Daniel
;
Baumbach, Tilo
;
Ponti, S.
;
Pietsch, Ullrich
;
Leprince, L.
;
Schneck, J.
;
Talneau, A.
HRXRD and GID investigations of a self-organized SiGe quantum dot multilayer
(1999)
Holý, Václav
;
Darhuber, A.
;
Stangl, Jochen
;
Zerlauth, S.
;
Schäffler, F.
;
Bauer, Günther
;
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
;
Vavra, I.
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7
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