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Ab initio calculations for XPS chemical shifts of poly(vinyl-trifluoroacetate) using trimer models
(2011)
X-ray photoelectron spectra (XPS) of the polymer poly(vinyl-trifluoroacetate) show C(1s) binding energy shifts which are unusual because they are influenced by atoms which are several bonds away from the probed atom. In this work, the influence of the trifluoroacetate substituent on the 1s ionization potential of the carbon atoms of the polyethylene chain is investigated theoretically using mono-substituted, diad and triad models of trimers representing the polymer. Carbon 1s ionization energies are calculated by the Hartree-Fock theory employing Koopmans' theorem. The influence of the configuration and conformation of the functional groups as well as the degree of substitution are found to be important determinants of XPS spectra. It is further found that the 1s binding energy correlates in a linear fashion, with the total electrostatic potential at the position of the probe atom, and depends not only on nearest neighbor effects. This may have implications for the interpretation of high-resolution XP spectra.
Recently, C K-edge Near Edge X-ray Absorption Fine Structure (NEXAFS) spectra of graphite (HOPG) surfaces have been measured for the pristine material, and for HOPG treated with either bromine or krypton plasmas (Lippitz et al., Surf. Sci., 2013, 611, L1). Changes of the NEXAFS spectra characteristic for physical (krypton) and/or chemical/physical modifications of the surface (bromine) upon plasma treatment were observed. Their molecular origin, however, remained elusive. In this work we study by density functional theory, the effects of selected point and line defects as well as chemical modifications on NEXAFS carbon K-edge spectra of single graphene layers. For Br-treated surfaces, also Br 3d X-ray Photoelectron Spectra (XPS) are simulated by a cluster approach, to identify possible chemical modifications. We observe that some of the defects related to plasma treatment lead to characteristic changes of NEXAFS spectra, similar to those in experiment. Theory provides possible microscopic origins for these changes.
Recently, C K-edge Near Edge X-ray Absorption Fine Structure (NEXAFS) spectra of graphite (HOPG) surfaces have been measured for the pristine material, and for HOPG treated with either bromine or krypton plasmas (Lippitz et al., Surf. Sci., 2013, 611, L1). Changes of the NEXAFS spectra characteristic for physical (krypton) and/or chemical/physical modifications of the surface (bromine) upon plasma treatment were observed. Their molecular origin, however, remained elusive. In this work we study by density functional theory, the effects of selected point and line defects as well as chemical modifications on NEXAFS carbon K-edge spectra of single graphene layers. For Br-treated surfaces, also Br 3d X-ray Photoelectron Spectra (XPS) are simulated by a cluster approach, to identify possible chemical modifications. We observe that some of the defects related to plasma treatment lead to characteristic changes of NEXAFS spectra, similar to those in experiment. Theory provides possible microscopic origins for these changes.
Recently, C K-edge Near Edge X-ray Absorption Fine Structure (NEXAFS) spectra of graphite (HOPG) surfaces have been measured for the pristine material, and for HOPG treated with either bromine or krypton plasmas (Lippitz et al., Surf. Sci., 2013, 611, L1). Changes of the NEXAFS spectra characteristic for physical (krypton) and/or chemical/physical modifications of the surface (bromine) upon plasma treatment were observed. Their molecular origin, however, remained elusive. In this work we study by density functional theory, the effects of selected point and line defects as well as chemical modifications on NEXAFS carbon K-edge spectra of single graphene layers. For Br-treated surfaces, also Br 3d X-ray Photoelectron Spectra (XPS) are simulated by a cluster approach, to identify possible chemical modifications. We observe that some of the defects related to plasma treatment lead to characteristic changes of NEXAFS spectra, similar to those in experiment. Theory provides possible microscopic origins for these changes.
Organosilanes are used routinely to functionalize various support materials for further modifications. Nevertheless, reliable quantitative information about surface functional group densities after layer formation is rarely available. Here, we present the analysis of thin organic nanolayers made from nitrogen containing silane molecules on naturally oxidized silicon wafers with reference-free total reflection X-ray fluorescence (TXR.F) and X-ray photoelectron spectroscopy (XPS). An areic density of 2-4 silane molecules per nm(2) was calculated from the layer's nitrogen mass deposition per area unit obtained by reference-free TXRF. Complementary energy and angle-resolved XPS (ER/AR-XPS) in the Si 2p core-level region was used to analyze the outermost surface region of the organic (silane layer)-inorganic (silicon wafer) interface. Different coexisting silicon species as silicon, native silicon oxide, and silane were identified and quantified. As a result of the presented proof-of-concept, absolute and traceable values for the areic density of silanes containing nitrogen as intrinsic marker are obtained by calibration of the XPS methods with reference-free TXRF. Furthermore, ER/AR-XPS is shown to facilitate the determination of areic densities in (mono)layers made from silanes having no heteroatomic marker other than silicon. After calibration with reference-free TXRF, these areic densities of silane molecules can be determined when using the XPS component intensity of the silane's silicon atom.
X-ray photoelectron spectroscopy (XPS) is a powerful tool for probing the local chemical environment of atoms near surfaces. When applied to soft matter, such as polymers, XPS spectra are frequently shifted and broadened due to thermal atom motion and by interchain interactions. We present a combined quantum mechanical QM/molecular dynamics (MD) simulation of X-ray photoelectron spectra of polyvinyl alcohol (PVA) using oligomer models in order to account for and quantify these effects on the XPS (C1s) signal. In our study, molecular dynamics at finite temperature were performed with a classical forcefield and by ab initio MD (AIMD) using the Car-Parrinello method. Snapshots along, the trajectories represent possible conformers and/or neighbouring environments, with different C1s ionization potentials for individual C atoms leading to broadened XPS peaks. The latter are determined by Delta-Kohn Sham calculations. We also examine the experimental practice of gauging XPS (C1s) signals of alkylic C-atoms in C-containing polymers to the C1s signal of polyethylene.
We find that (i) the experimental XPS (C1s) spectra of PVA (position and width) can be roughly represented by single-strand models, (ii) interchain interactions lead to red-shifts of the XPS peaks by about 0.6 eV, and (iii) AIMD simulations match the findings from classical MD semi-quantitatively. Further, (iv) the gauging procedure of XPS (C1s) signals to the values of PE, introduces errors of about 0.5 eV. (C) 2014 Elsevier B.V. All rights reserved.
Synchrotron-radiation XPS analysis of ultra-thin silane films: Specifying the organic silicon
(2016)
The analysis of chemical and elemental in-depth variations in ultra-thin organic layers with thicknesses below 5 nm is very challenging. Energy- and angle-resolved XPS (ER/AR-XPS) opens up the possibility for non-destructive chemical ultra-shallow depth profiling of the outermost surface layer of ultra-thin organic films due to its exceptional surface sensitivity. For common organic materials a reliable chemical in-depth analysis with a lower limit of the XPS information depth z(95) of about 1 nm can be performed. As a proof-of-principle example with relevance for industrial applications the ER/AR-XPS analysis of different organic monolayers made of amino- or benzamidosilane molecules on silicon oxide surfaces is presented. It is demonstrated how to use the Si 2p core-level region to non-destructively depth-profile the organic (silane monolayer) - inorganic (SiO2/Si) interface and how to quantify Si species, ranging from elemental silicon over native silicon oxide to the silane itself. The main advantage of the applied ER/AR-XPS method is the improved specification of organic from inorganic silicon components in Si 2p core-level spectra with exceptional low uncertainties compared to conventional laboratory XPS. (C) 2015 Elsevier B.V. All rights reserved.
alpha-Methylene-gamma-butyrolactone and alpha-methylene-gamma-valerolactone undergo Pd-catalyzed Matsuda-Heck couplings with arene diazonium salts to alpha-benzyl butenolides or pentenolides, respectively, or to alpha-benzylidene lactones. The observed regioselectivity is strongly ring size dependent, with six-membered rings giving exclusively alpha-benzyl pentenolides, whereas the five-membered alpha-methylene lactone reacts to mixtures of regioisomers with a high proportion of (E)-alpha-benzylidene-gamma-butyrolactones. DFT calculations suggest that the reasons for these differences are not thermodynamic but kinetic in nature. The relative energies of the conformers of the Pd sigma-complexes resulting from insertion into the Pd-aryl bond were correlated with the dihedral angles between Pd and endo-beta-H. This correlation revealed that in the case of the six-membered lactone an energetically favorable conformer adopts a nearly synperiplanar Pd/endo-beta-H arrangement, whereas for the analogous Pd sigma-complex of the five-membered lactone the smallest Pd/endo-beta-H dihedral angle is observed for a conformer with a comparatively high potential energy. The optimized conditions for Matsuda-Heck arylations of exo-methylene lactones were eventually applied to the synthesis of the natural product anemarcoumarin A.
In Near Edge X-Ray Absorption Fine Structure (NEXAFS) spectroscopy X-Ray photons are used to excite tightly bound core electrons to low-lying unoccupied orbitals of the system. This technique offers insight into the electronic structure of the system as well as useful structural information. In this work, we apply NEXAFS to two kinds of imidazolium based ionic liquids ([C(n)C(1)im](+)[NTf2](-) and [C(4)C(1)im](+)[I](-)). A combination of measurements and quantum chemical calculations of C K and N K NEXAFS resonances is presented. The simulations, based on the transition potential density functional theory method (TP-DFT), reproduce all characteristic features observed by the experiment. Furthermore, a detailed assignment of resonance features to excitation centers (carbon or nitrogen atoms) leads to a consistent interpretation of the spectra.
Die vorgelegte Dissertation präsentiert wissenschaftliche Ergebnisse, die in der Zeit vom Dezember 2012 bis August 2016, erarbeitet wurden. Der zentrale Inhalt der Arbeit ist die Simulation von Röntgenabsorptionsprozessen von verschiedenen Systemen in kondensierter Phase. Genauer gesagt, werden Nahkantenabsorptions- (NEXAFS) sowie Röntgenphotoelektronenspektren (XPS) berechnet. In beiden Fällen wird ein Röntgenphoton von einem molekularen System absorbiert. Aufgrund der hohen Photonenenergie wird ein stark gebundenes kernnahes Elektron angeregt. Bei der XPS gelangt dieses mit einer zu messenden kinetischen Energie in Kontinuumszustände. In Abhängigkeit der eingestrahlten Photonenenergie und der kinetischen Energie des austreten Elektrons, kann die Bindungsenergie berechnet werden, welche die zentrale Größe der XPS ist. Im Falle der NEXAFS-Spektroskopie wird das kernnahe Elektron in unbesetzte gebundene Zustände angeregt. Die zentrale Größe ist die Absorption als Funktion der eingestrahlten Photonenenergie. Das erste Kapitel meiner Arbeit erörtert detailliert die experimentellen Methoden sowie die daraus gewonnenen charakteristischen Größen.
Die experimentellen Spektren zeigen oft viele Resonanzen, deren Interpretation aufgrund fehlender Referenzmaterialien schwierig ist. In solchen Fällen bietet es sich an, die Spektren mittels quantenchemischer Methoden zu simulieren. Der dafür erforderliche mathematisch-physikalische Methodenkatalog wird im zweiten Kapitel der Arbeit erörtert.
Das erste von mir untersuchte System ist Graphen. In experimentellen Arbeiten wurde die Oberfläche mittels Bromplasma modifiziert. Die im Anschluss gemessenen NEXAFS-Spektren unterscheiden sich maßgeblich von den Spektren der unbehandelten Oberfläche. Mithilfe periodischer DFT-Rechnungen wurden verschiedene Gitterdefekte sowie bromierte Systeme untersucht und die NEXAFS-Spektren simuliert. Mittels der Simulationen können die Beiträge verschiedener Anregungszentren analysiert werden. Die Berechnungen erlauben den Schluss, dass Gitterdefekte maßgeblich für die entstandenen Veränderungen verantwortlich sind.
Polyvinylalkohol (PVA) wurde als zweites System behandelt. Hierbei sollte untersucht werden, wie groß der Einfluss der Molekularbewegung auf die Verbreiterung der Peaks im XP-Spektrum ist. Des Weiteren wurde untersucht, wie groß der Einfluss von intermolekularen Wechselwirkungen auf die Peakpositionen und Peakverbreiterung ist. Für die Berechnung dieses Systems wurde eine Kombination aus molekulardynamischen und quantenchemischen Methoden verwendet. Als Strukturen dienten Oligomermodelle, die unter dem Einfluss eines (ab initio) Potentials propagiert wurden. Entlang der erstellten Trajektorie wurden Schnappschüsse der Geometrien extrahiert und für die Berechnung der XP-Spektren verwendet. Die Spektren werden bereits mithilfe klassischer Molekulardynamik sehr gut reproduziert. Die erhaltenen Peakbreiten sind verglichen mit dem Experiment allerdings zu klein. Die Hauptursache der Peakverbreiterung ist die Molekularbewegung. Intermolekulare Wechselwirkungen verschieben die Peakpositionen um 0.6 eV zu kleineren Anregungsenergien.
Im dritten Teil der Arbeit stehen die NEXAFS-Spektren von ionischen Flüssigkeiten (ILs) im Fokus. Die experimentell gefundenen Spektren zeigen eine komplexe Struktur mit vielen Resonanzen. In der Arbeit wurden zwei ILs untersucht. Als Geometrien verwenden wir Clustermodelle, die aus experimentellen Kristallstrukturen extrahiert wurden. Die berechneten Spektren erlauben es, die Resonanzen den Anregungszentren zuzuordnen. Außerdem kann eine erstmals gemessene Doppelresonanz simuliert und erklärt werden. Insgesamt kann die Interpretation der Spektren mithilfe der Simulation signifikant erweitert werden.
In allen Systemen wurde zur Berechnung des NEXAFS-Spektrums eine auf Dichtefunktionaltheorie basierende Methode verwendet (die sogenannte Transition-Potential Methode). Gängige wellenfunktionsbasierte Methoden, wie die Konfigurationswechselwirkung mit Einfachanregungen (CIS), zeigen eine starke Blauverschiebung, wenn als Referenz eine Hartree-Fock Slaterdeterminante verwendet wird. Wir zeigen, dass die Verwendung von kernnah-angeregten Determinanten sowohl das resultierende Spektrum als auch die Anregungsenergien deutlich verbessert. Des Weiteren werden auch Referenzen aus Dichtefunktionalrechnungen getestet. Zusätzlich werden auch Referenzen mit gebrochenen Besetzungszahlen für kernnahe Elektronen verwendet. In der Arbeit werden die Resultate der verschiedenen Referenzen miteinander verglichen. Es zeigt sich, dass Referenzen mit gebrochenen Besetzungszahlen das Spektrum nicht weiter verbessern. Der Einfluss der verwendeten Elektronenstrukturmethode ist eher gering.