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Seuring, Markus (8)
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1999
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Institut für Informatik und Computational Science
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Built-in self test mit multi-mode scannable memory elementen
(1999)
Seuring, Markus
A structural approach for space compaction for sequential circuits
(1999)
Seuring, Markus
;
Gössel, Michael
A structural method for output compaction of sequential automata implemented as circuits
(1999)
Seuring, Markus
;
Gössel, Michael
A structural approach for space compaction for sequential circuits
(1998)
Seuring, Markus
;
Gössel, Michael
A structural approach for space compaction for concurrent checking and BIST
(1998)
Seuring, Markus
;
Gössel, Michael
;
Sogomonyan, Egor S.
Ein strukturelles Verfahren zur Kompaktierung von Schaltungsausgaben für online-Fehlererkennungen und Selbstests
(1998)
Seuring, Markus
;
Gössel, Michael
;
Sogomonyan, Egor S.
A structural approach for space compaction for concurrent checking and BIST
(1997)
Seuring, Markus
;
Gössel, Michael
;
Sogomonyan, Egor S.
Testability evaluation of sequential designs incorporating the multi-mode scannable memory element
(1999)
Singh, Adit D.
;
Sogomonyan, Egor S.
;
Gössel, Michael
;
Seuring, Markus
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8
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