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Near ambient pressure - x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i.e., at 2500Pa or higher. With NAP-XPS, one can analyze moderately volatile liquids, biological samples, porous materials, and/or polymeric materials that outgas significantly. In this submission we show C 1s, O 1s, and survey NAP-XPS spectra from poly(L-lactic acid). The C 1s and O 1s envelopes were fit with three and two Gaussian-Lorentzian sum functions, respectively. Water vapor (800Pa) was used as the residual gas for charge compensation, which was confirmed by the sharp peak at 535.0 eV in the O 1s narrow scan. The uniqueness plot corresponding to the C 1s fit shows that the fit parameters had statistical significance. C 1s and O 1s spectra of PLLA damaged by exposure to x-rays for ca. 1 hour are also included. Published by the AVS.
Near-ambient pressure x-ray photoelectron spectroscopy (NAP-XPS) is a less traditional form of XPS that allows samples to be analyzed at relatively high pressures, i. e., at greater than 2500 Pa. In this study, poly(.- benzyl L- glutamate) (PBLG) with a molar mass of 11.3 kg/mol was analyzed by NAP-XPS; here, we show the survey, C 1s, N 1s, and O 1s narrow scans of PBLG. The C 1s peak envelope was fitted in three different ways, to five, six, or seven synthetic peaks. In each fit, there was also a shake-up signal. The O 1s narrow scan was well fit with three peaks: CZO and CvO in a 1:2 ratio from the polymer, and a higher energy signal from water vapor. Hartree-Fock orbital energies of a model monomer served as a guide to an additional fit of the C 1s envelope.