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Context. Most theoretical investigations of dust charging processes in space have treated the current balance condition as independent of grain size. However, for small grains, since they are often observed in space environments, a dependence on grain size is expected owing to secondary electron emission (SEE). Here, by the term "small" we mean a particle size comparable to the typical penetration depth for given primary electron energy. The results are relevant for the dynamics of small, charged dust particles emitted by the volcanic moon Io, which forms the Jovian dust streams. Aims. We revise the theory of charging of small (submicron sized) micrometeoroids to take into account a high production of secondary electrons for small grains immersed in an isotropic flux of electrons. We apply our model to obtain an improved estimate for the charge of the dust streams leaving the Jovian system, detected by several spacecraft. Methods. We apply a continuum model to describe the penetration of primary electrons in a grain and the emission of secondary electrons along the path. Averaging over an isotropic flux of primaries, we derive a new expression for the secondary electron yield, which can be used to express the secondary electron current on a grain. Results. For the Jupiter plasma environment we derive the surface potential of grains composed of NaCl (believed to be the major constituent of Jovian dust stream particles) or silicates. For small particles, the potential depends on grain size and the secondary electron current induces a sensitivity to material properties. As a result of the small particle effect, the estimates for the charging times and for the fractional charge fluctuations of NaCl grains obtained using our general approach to SEE give results qualitatively different from the analogous estimates derived from the traditional approach to SEE. We find that for the charging environment considered in this paper field emission does not limit the charging of NaCl grains.
It is found that for objects possessing small surface structures with differing radii of curvature the secondary electron emission (SEE) yield may be significantly higher than for objects with smooth surfaces of the same material. The effect is highly pronounced for surface structures of nanometer scale, often providing a more than 100% increase of the SEE yield. The results also show that the SEE yield from surfaces with structure does not show a universal dependence on the energy of the primary, incident electrons as it is found for flat surfaces in experiments. We derive conditions for the applicability of the conventional formulation of SEE using the simplifying assumption of universal dependence. Our analysis provides a basis for studying low-energy electron emission from nanometer structured surfaces under a penetrating electron beam important in many technological applications.