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Reliability tests for wavelength-stabilized compact diode laser systems emitting at 671 nm are presented. The devices were mounted on microoptical benches with the dimensions of 13 mm x 4 mm. Reflecting Bragg gratings were used for wavelength stabilization and emission width narrowing. The reliability tests were performed at 25 degrees C and at an output power up to 10 mW per micrometer stripe width of the gain medium. Reliable operation could be demonstrated over a test time up to 14 500 h at an output power up to 1.0 W. Environmental tests using random vibrations with acceleration up to 29 g were performed without deterioration of the devices.
Stabilized multi-wavelength emission from a single emitter broad area diode laser (BAL) is realized by utilizing an external cavity with a spectral beam combining architecture. Self-organized emitters that are equidistantly spaced across the slow axis are enforced by the spatially distributed wavelength selectivity of the external cavity. This resulted in an array like near-field emission although the BAL is physically a single emitter without any epitaxial sub-structuring and only one electrical contact. Each of the self-organized emitters is operated at a different wavelength and the emission is multiplexed into one spatial mode with near-diffraction limited beam quality. With this setup, multi-line emission of 31 individual spectral lines centered around and a total spectral width of 3.6 nm is realized with a 1000 mu m wide BAL just above threshold. To the best of our knowledge, this is the first demonstration of such a self-organization of emitters by optical feedback utilizing a spectral beam combining architecture.