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(12)
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Gössel, Michael (12)
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1998 (12)
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Article
(11)
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(10)
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(12)
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Institut für Informatik und Computational Science (12)
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A multi-mode scannable memory element for high test application efficiency and delay testing
(1998)
Sogomonyan, Egor S.
;
Singh, Adit D.
;
Gössel, Michael
A scan based concrrent BIST approach for low cost on-line testing
(1998)
Sogomonyan, Egor S.
;
Singh, Adit D.
;
Gössel, Michael
Ein strukturelles Verfahren zur Kompaktierung von Schaltungsausgaben für online-Fehlererkennungen und Selbstests
(1998)
Seuring, Markus
;
Gössel, Michael
;
Sogomonyan, Egor S.
A structural approach for space compaction for concurrent checking and BIST
(1998)
Seuring, Markus
;
Gössel, Michael
;
Sogomonyan, Egor S.
A structural approach for space compaction for sequential circuits
(1998)
Seuring, Markus
;
Gössel, Michael
Self-dual duplication for error detection
(1998)
Saposhnikov, Vl. V.
;
Saposhnikov, V. V.
;
Dimitriev, Alexej
;
Gössel, Michael
Design of Fault-Tolerant Circuits by self-dual Duplication
(1998)
Saposhnikov, Vl. V.
;
Otscheretnij, Vitalij
;
Saposhnikov, V. V.
;
Gössel, Michael
A new design method for self-checking unidirectional combinational circuits
(1998)
Saposhnikov, V. V.
;
Morosov, Andrej
;
Saposhnikov, Vl. V.
;
Gössel, Michael
Fault-tolerant self-dual circuits with error detection by parity- and group parity prediction
(1998)
Otscheretnij, Vitalij
;
Gössel, Michael
;
Saposhnikov, Vl. V.
;
Saposhnikov, V. V.
Self-Checking circuits with unidiectionally independent outputs
(1998)
Morosov, Andrej
;
Saposhnikov, V. V.
;
Gössel, Michael
On-line Test auf der Grundlage eines die Parität erhaltenden Signaturanalysators
(1998)
Gössel, Michael
;
Sogomonyan, Egor S.
Built-in self-Test with an alternating output
(1998)
Bogue, Ted
;
Gössel, Michael
;
Jürgensen, Helmut
;
Zorian, Yervant
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12
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