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Baumbach, Tilo (9)
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Grazing incidence diffraction by epitaxial multilayered gratings
(1998)
Baumbach, Tilo
;
Lübbert, Daniel
;
Pietsch, Uwe
;
Darowski, Nora
;
Leprince, L.
;
Talneau, A.
;
Schneck, J.
High resolution X-ray scattering from thin films and lateral nanostructures
(2004)
Pietsch, Ullrich
;
Holý, Václav
;
Baumbach, Tilo
High-resolution x-ray scattering from thin films and multilayers
(1999)
Holý, Václav
;
Pietsch, Ullrich
;
Baumbach, Tilo
Identification of a buried single quantum well within surface structurized semiconductors using depth resolved x-ray grazing-incidence diffraction
(1997)
Darowski, Nora
;
Paschke, K.
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Baumbach, Tilo
;
Zeimer, Ute
In-situ characterization of strain distribution in broad-area high-power lasers under operation by high- resolution x-ray diffrcation and topography using synchrotron radiation
(1999)
Zeimer, Ute
;
Baumbach, Tilo
;
Grenzer, Jörg
;
Lübbert, Daniel
;
Mazuelas, A.
;
Pietsch, Ullrich
;
Erbert, G.
Investigation of the in-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001]
(1999)
Ulyanenkov, A.
;
Baumbach, Tilo
;
Darowski, Nora
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Wiebach, T.
Strain investigation of low strained buried gratings by grazing incidence X-Ray diffraction and the theory of elasticity
(1999)
Lübbert, Daniel
;
Baumbach, Tilo
;
Ponti, S.
;
Pietsch, Ullrich
;
Leprince, L.
;
Schneck, J.
;
Talneau, A.
Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction
(1998)
Darowski, Nora
;
Paschke, K.
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Lübbert, Daniel
;
Baumbach, Tilo
X-Ray scattering by periodic nanostructures
(2000)
Baumbach, Tilo
1
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9
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