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Darowski, Nora (5)
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1998 (5)
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English
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Institut für Physik und Astronomie
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Nondestructive analysis of a lateral GaAs nanostructure buried under AlGaAs using conventional high resolution and grazing incidence X-ray diffraction
(1998)
Darowski, Nora
;
Pietsch, Ullrich
;
Zeimer, Ute
;
Smirnitzki, V.
;
Bugge, F.
X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures
(1998)
Darowski, Nora
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Shen, W.
;
Kycia, S.
Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction
(1998)
Darowski, Nora
;
Paschke, K.
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Lübbert, Daniel
;
Baumbach, Tilo
In-plane strain and strain relaxation in laterally patterned Si/SiGe quantum dots and wire arrays
(1998)
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
;
Zhuang, Y.
;
Zerlauth, S.
;
Bauer, Günther
Grazing incidence diffraction by epitaxial multilayered gratings
(1998)
Baumbach, Tilo
;
Lübbert, Daniel
;
Pietsch, Uwe
;
Darowski, Nora
;
Leprince, L.
;
Talneau, A.
;
Schneck, J.
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