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Geue, Thomas (6)
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2003 (6)
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English
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Institut für Physik und Astronomie
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X-ray reflectivity study of an amphiphilic hex-peri-hexabenzocoronene at a structured silicon wafer surface
(2003)
Pietsch, Ullrich
;
Kubowicz, Stephan
;
Thünemann, Andreas F.
;
Geue, Thomas
;
Watson, M. D.
;
Tchebotareva, N.
;
Müllen, K.
X-ray investigations of formation efficiency of buried azobenzene polymer density gratings
(2003)
Pietsch, Ullrich
;
Geue, Thomas
;
Henneberg, Oliver
;
Saphiannikova, Marina
X-ray and VIS light scattering from light-induced polymer gratings
(2003)
Henneberg, Oliver
;
Geue, Thomas
;
Saphiannikova, Marina
;
Pietsch, Ullrich
;
Rochon, Paul
Using light as a tool : optically Induced mass transport generated in Near-Fields
(2003)
Stiller, Burkhard
;
Karageorgiev, Peter
;
Buchsteiner, Andrea
;
Geue, Thomas
;
Henneberg, Oliver
;
Brehmer, Ludwig
;
Natansohn, Almeria
;
Hollricher, Olga
Energy dispersive x-ray reflectivity technique to study thermal properties of polymer films
(2003)
Pietsch, Ullrich
;
Bhattacharya, M. K.
;
Mukherjee, M.
;
Sanyal, M. K.
;
Geue, Thomas
;
Grenzer, Jörg
Coherence experiments at the energy-dispersive reflectometry beamline at BESSY II
(2003)
Pietsch, Ullrich
;
Panzner, Tobias
;
Leitenberger, Wolfram
;
Grenzer, Jörg
;
Bodenthin, Th.
;
Geue, Thomas
;
Möhwald, Helmuth
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