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Forchel, Alfred (9)
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2001
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Institut für Physik und Astronomie
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Analysis of the strain distribution in lateral nanostructures for interpreting photoluminescence data
(2000)
Pietsch, Ullrich
;
Darowski, Nora
;
Ulyanenkov, A.
;
Grenzer, Jörg
;
Wang, K. H.
;
Forchel, Alfred
Characterization of lateral semiconductor nano structures by means of x-ray grazing-incidence diffraction
(1997)
Paschke, K.
;
Geue, Thomas
;
Barberka, Thomas Andreas
;
Bolm, A.
;
Pietsch, Ullrich
;
Rösch, M.
;
Batke, Edwin
;
Faller, F.
;
Kerkel, K.
;
Oshiniwo, J.
;
Forchel, Alfred
Evaluation of strain distribution in freestanding and bruied lateral nanostructures
(1999)
Ulyanenkov, A.
;
Darowski, Nora
;
Grenzer, Jörg
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
Grazing-incidence diffraction strain analysis of a laterally-modulated multiquantum well system produced by focused-ion-beam implantation
(2000)
Grenzer, Jörg
;
Darowski, Nora
;
Pietsch, Ullrich
;
Daniel, A.
;
Reithmaier, Johann-Peter
;
Rennon, Siegfried
;
Forchel, Alfred
Identification of a buried single quantum well within surface structurized semiconductors using depth resolved x-ray grazing-incidence diffraction
(1997)
Darowski, Nora
;
Paschke, K.
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Baumbach, Tilo
;
Zeimer, Ute
Investigation of the in-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001]
(1999)
Ulyanenkov, A.
;
Baumbach, Tilo
;
Darowski, Nora
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Wiebach, T.
Strain analysis and quantum well intermixing of a laterally modulated multiquantum well system produced by focused ion beam implantation
(2001)
Grenzer, Jörg
;
Darowski, Nora
;
Geue, Thomas
;
Pietsch, Ullrich
;
Daniel, A.
;
Rennon, Siegfried
;
Reithmaier, Johann-Peter
;
Forchel, Alfred
Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction
(1998)
Darowski, Nora
;
Paschke, K.
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Lübbert, Daniel
;
Baumbach, Tilo
X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures
(1998)
Darowski, Nora
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Shen, W.
;
Kycia, S.
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