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no (18)
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Pietsch, Ullrich (18)
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1999 (18)
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Article
(17)
Monograph/Edited Volume
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English
(18)
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Institut für Physik und Astronomie
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HRXRD and GID investigations of a self-organized SiGe quantum dot multilayer
(1999)
Holý, Václav
;
Darhuber, A.
;
Stangl, Jochen
;
Zerlauth, S.
;
Schäffler, F.
;
Bauer, Günther
;
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
;
Vavra, I.
High-resolution x-ray scattering from thin films and multilayers
(1999)
Holý, Václav
;
Pietsch, Ullrich
;
Baumbach, Tilo
High-resolution lattice parameter measurement by x-ray grazing incidence diffraction: Application to the interface of silicon on sapphire
(1999)
Metzger, T. H.
;
Pietsch, Ullrich
;
Garstein, E.
Experimental determination of electric field induced differences in structure factor phases in the order of 2%
(1999)
Stahn, Jochen
;
Pucher, Andreas
;
Pietsch, Ullrich
;
Zellner, J.
;
Weckert, E.
Evaluation of strain distribution in freestanding and bruied lateral nanostructures
(1999)
Ulyanenkov, A.
;
Darowski, Nora
;
Grenzer, Jörg
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
Energy-dispersive reflectometry and diffractometry at the WLS of BESSY-I
(1999)
Neißendorfer, Frank
;
Pietsch, Ullrich
;
Breszisinski, G.
;
Möhwald, Helmuth
Competition of alignment and aggregation? : Phenomena in constrained films of LC poly(olefin ulfone)s and maleic anhydride co- and terpolymers
(1999)
Geue, Thomas
;
Pietsch, Ullrich
;
Haferkorn, J.
;
Stumpe, Joachim
;
Date, R. W.
;
Fawcett, A. H.
Chemical modification of Topaz surfaces
(1999)
Struth, Bernd
;
Decher, Gero
;
Schmitt, J.
;
Hofmeister, Wolfgang
;
Neißendorfer, Frank
;
Pietsch, Ullrich
;
Brezesinski, Gerald
;
Möhwald, Helmuth
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18
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