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Geue, Thomas (7)
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2001 (7)
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X-ray reflectivity analysis of thin complex Langmuir-Blodgett films
(2001)
Poloucek, P.
;
Pietsch, Ullrich
;
Geue, Thomas
;
Symietz, Christian
;
Brezesinski, Gerald
The energy dispersive reflectometer at BESSY II : a challenge for thin film analysis
(2001)
Pietsch, Ullrich
;
Grenzer, Jörg
;
Geue, Thomas
;
Neißendorfer, Frank
;
Brezesinski, Gerald
;
Symietz, Christian
;
Möhwald, Helmuth
;
Gudat, Wolfgang
Strain analysis and quantum well intermixing of a laterally modulated multiquantum well system produced by focused ion beam implantation
(2001)
Grenzer, Jörg
;
Darowski, Nora
;
Geue, Thomas
;
Pietsch, Ullrich
;
Daniel, A.
;
Rennon, Siegfried
;
Reithmaier, Johann-Peter
;
Forchel, Alfred
Metal ion mediated mesomorphism and thin film behaviour of amphitropic tetraazaporphyrin complexes
(2001)
Eichhorn, Holger
;
Bruce, Duncan W.
;
Guillon, D.
;
Gallani, Jean Louis
;
Fischer, Thomas
;
Stumpe, Joachim
;
Geue, Thomas
Synchrotron Studies of Melting of Langmuir-Blodgett Films
(2001)
Mukhopadhyay, M. K.
;
Datta, A.
;
Sanyal, M. K.
;
Geue, Thomas
;
Pietsch, Ullrich
Formation and dynamics of polymer surface relief gratings
(2001)
Henneberg, Oliver
;
Geue, Thomas
;
Saphiannikova, Marina
;
Pietsch, Ullrich
;
Rochon, Paul
;
Natansohn, Almeria
Atomic force microscopy inspection of the early state of formation of polymer surface relief grating
(2001)
Henneberg, Oliver
;
Chi, Li Feng
;
Geue, Thomas
;
Saphiannikova, Marina
;
Pietsch, Ullrich
;
Rochon, Paul
;
Natansohn, Almeria
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7
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