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Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction
(1998)
Darowski, Nora
;
Paschke, K.
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Lübbert, Daniel
;
Baumbach, Tilo
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