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Darowski, Nora (15)
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2001
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(15)
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Institut für Physik und Astronomie
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X-ray diffraction analysis of strain relaxation in free standing and buried GaAs/GaInAs/GaAs SQW lateral structures
(1998)
Darowski, Nora
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Shen, W.
;
Kycia, S.
Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction
(1998)
Darowski, Nora
;
Paschke, K.
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Lübbert, Daniel
;
Baumbach, Tilo
Strain relaxation in periodic arrays of Si/SiGe quantum wires determined by coplanar high-resolution x-ray diffrcation and grazing-incidence diffraction
(1999)
Zhuang, Y.
;
Holý, Václav
;
Stangl, Jochen
;
Darhuber, A.
;
Mikulik, P.
;
Zerlauth, S.
;
Schäffler, F.
;
Bauer, Günther
;
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
Strain analysis and quantum well intermixing of a laterally modulated multiquantum well system produced by focused ion beam implantation
(2001)
Grenzer, Jörg
;
Darowski, Nora
;
Geue, Thomas
;
Pietsch, Ullrich
;
Daniel, A.
;
Rennon, Siegfried
;
Reithmaier, Johann-Peter
;
Forchel, Alfred
Nondestructive analysis of a lateral GaAs nanostructure buried under AlGaAs using conventional high resolution and grazing incidence X-ray diffraction
(1998)
Darowski, Nora
;
Pietsch, Ullrich
;
Zeimer, Ute
;
Smirnitzki, V.
;
Bugge, F.
Lateral arrangement of self-assembled quantum dots in an SiGe/Si superlattice
(1999)
Holý, Václav
;
Stangl, Jochen
;
Zerlauth, S.
;
Bauer, Günther
;
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
Investigation of the in-plane strain distribution in free-standing GaAs/InGaAs/GaAs single quantum well surface nanostructures on GaAs[001]
(1999)
Ulyanenkov, A.
;
Baumbach, Tilo
;
Darowski, Nora
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Wiebach, T.
In-plane strain and strain relaxation in laterally patterned Si/SiGe quantum dots and wire arrays
(1998)
Darowski, Nora
;
Lübbert, Daniel
;
Pietsch, Ullrich
;
Zhuang, Y.
;
Zerlauth, S.
;
Bauer, Günther
In-plane strain and shape analysis of Si/SiGe nanostructures by grazing incidence diffraction
(2000)
Zhuang, Y.
;
Pietsch, Ullrich
;
Stangl, Jochen
;
Holý, Vaclav
;
Darowski, Nora
;
Grenzer, Jörg
;
Zerlauth, S.
;
Schäffler, F.
;
Bauer, Günther
Identification of a buried single quantum well within surface structurized semiconductors using depth resolved x-ray grazing-incidence diffraction
(1997)
Darowski, Nora
;
Paschke, K.
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Baumbach, Tilo
;
Zeimer, Ute
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10
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