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X-ray reflectivity study of an amphiphilic hex-peri-hexabenzocoronene at a structured silicon wafer surface
(2003)
Pietsch, Ullrich
;
Kubowicz, Stephan
;
Thünemann, Andreas F.
;
Geue, Thomas
;
Watson, M. D.
;
Tchebotareva, N.
;
Müllen, K.
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