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Bolm, A. (3)
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1997
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Institut für Physik und Astronomie
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Temperature and time dependent investigations of cd- and uranyl-stearate multilayers by means of neutron reflectivity measurements
(1997)
Bolm, A.
;
Englisch, Uwe
;
Penacorada, Florencio
;
Gerstenberger, M.
;
Pietsch, Ullrich
Characterization of lateral semiconductor nano structures by means of x-ray grazing-incidence diffraction
(1997)
Paschke, K.
;
Geue, Thomas
;
Barberka, Thomas Andreas
;
Bolm, A.
;
Pietsch, Ullrich
;
Rösch, M.
;
Batke, Edwin
;
Faller, F.
;
Kerkel, K.
;
Oshiniwo, J.
;
Forchel, Alfred
Energy dispersive X-ray reflectometry and X-ray grazing incidence diffraction from organic multilayers
(1997)
Neißendorfer, Frank
;
Bolm, A.
;
Pietsch, Ullrich
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