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Mathematisch-Naturwissenschaftliche Fakultät
Institut für Informatik und Computational Science
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Sogomonyan, Egor S. (26)
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Institut für Informatik und Computational Science
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Self-parity combinational-circuits for self-testing, concurrent fault-detection and parity scan design
(1994)
Gössel, Michael
;
Sogomonyan, Egor S.
Code disjoint self-parity combinational circuits for self-testing, concurrent fault detection and parity scan design
(1994)
Gössel, Michael
;
Sogomonyan, Egor S.
A new parity preserving multi-input signature analyser
(1995)
Sogomonyan, Egor S.
;
Gössel, Michael
A new self-testing parity checker for ultra-reliable applications
(1996)
Gössel, Michael
;
Sogomonyan, Egor S.
Concurrently self-testing embedded checkers for ultra-reliable fault-tolerant systems
(1996)
Sogomonyan, Egor S.
;
Gössel, Michael
A parity-preserving multi-input signature analyzer and it application for concurrent checking and BIST
(1996)
Gössel, Michael
;
Sogomonyan, Egor S.
Self-checking comparator with one periodiv output
(1996)
Kundu, S.
;
Sogomonyan, Egor S.
;
Gössel, Michael
;
Tarnick, Steffen
A linear code-preserving signature analyzer COPMISR
(1997)
Hlawiczka, A.
;
Gössel, Michael
;
Sogomonyan, Egor S.
Synthesis of code-disjoint combinational circuits
(1997)
Hartje, Hendrik
;
Gössel, Michael
;
Sogomonyan, Egor S.
A structural approach for space compaction for concurrent checking and BIST
(1997)
Seuring, Markus
;
Gössel, Michael
;
Sogomonyan, Egor S.
Code disjoint circuits for partity codes
(1997)
Hartje, Hendrik
;
Sogomonyan, Egor S.
;
Gössel, Michael
Ein strukturelles Verfahren zur Kompaktierung von Schaltungsausgaben für online-Fehlererkennungen und Selbstests
(1998)
Seuring, Markus
;
Gössel, Michael
;
Sogomonyan, Egor S.
On-line Test auf der Grundlage eines die Parität erhaltenden Signaturanalysators
(1998)
Gössel, Michael
;
Sogomonyan, Egor S.
A multi-mode scannable memory element for high test application efficiency and delay testing
(1998)
Sogomonyan, Egor S.
;
Singh, Adit D.
;
Gössel, Michael
A structural approach for space compaction for concurrent checking and BIST
(1998)
Seuring, Markus
;
Gössel, Michael
;
Sogomonyan, Egor S.
A scan based concrrent BIST approach for low cost on-line testing
(1998)
Sogomonyan, Egor S.
;
Singh, Adit D.
;
Gössel, Michael
Testability evaluation of sequential designs incorporating the multi-mode scannable memory element
(1999)
Singh, Adit D.
;
Sogomonyan, Egor S.
;
Gössel, Michael
;
Seuring, Markus
New totally self-checking ripple and carry look-ahead adders
(1999)
Gössel, Michael
;
Sogomonyan, Egor S.
A new totally error propagating compactor for arbitrary cores with digital interfaces
(1999)
Gössel, Michael
;
Sogomonyan, Egor S.
;
Morosov, Andrej
A multi-mode scannable memory element for high test application efficiency and delay testing
(1999)
Sogomonyan, Egor S.
;
Singh, Adit D.
;
Gössel, Michael
1
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20
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