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(3)
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Forchel, Alfred
(3)
Paschke, K.
(3)
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Baumbach, Tilo
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Darowski, Nora
(2)
Wang, K. H.
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Bolm, A.
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1998
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Institut für Physik und Astronomie
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Characterization of lateral semiconductor nano structures by means of x-ray grazing-incidence diffraction
(1997)
Paschke, K.
;
Geue, Thomas
;
Barberka, Thomas Andreas
;
Bolm, A.
;
Pietsch, Ullrich
;
Rösch, M.
;
Batke, Edwin
;
Faller, F.
;
Kerkel, K.
;
Oshiniwo, J.
;
Forchel, Alfred
Identification of a buried single quantum well within surface structurized semiconductors using depth resolved x-ray grazing-incidence diffraction
(1997)
Darowski, Nora
;
Paschke, K.
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Baumbach, Tilo
;
Zeimer, Ute
Structural characterization of a GaAs surface wire structure by triple-axis X-ray grazing incidence diffraction
(1998)
Darowski, Nora
;
Paschke, K.
;
Pietsch, Ullrich
;
Wang, K. H.
;
Forchel, Alfred
;
Lübbert, Daniel
;
Baumbach, Tilo
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